Tae-Un Youn

According to our database, Tae-Un Youn authored at least 2 papers between 2013 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2015

Effect of electric field polarity on inter-poly dielectric during cell operation for the retention characteristics.

Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Ilgu Yun

Microelectron. Reliab., 2015

2013

Methodology for improvement of data retention in floating gate flash memory using leakage current estimation.

Pyung Moon, Jun Yeong Lim, Tae-Un Youn, Keum-Whan Noh, Sung-Kye Park, Ilgu Yun

Microelectron. Reliab., 2013