Tae-Jin Chung
According to our database1,
Tae-Jin Chung
authored at least 3 papers
between 2000 and 2022.
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Bibliography
2022
Middle-of-the-Line Reliability Characterization of Recessed-Diffusion-Contact Adopted sub-5nm Logic Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2015
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015
2000
Proceedings of the 39th IEEE Conference on Decision and Control, 2000