Tadahiro Shibutani

Orcid: 0000-0003-3205-4268

According to our database1, Tadahiro Shibutani authored at least 14 papers between 2008 and 2021.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of five.

Timeline

Legend:

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PhD thesis 
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Links

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Bibliography

2021
Fabrication of doubly-curved CFRP shell structures with control over fiber directions.
Comput. Aided Des., 2021

2018
Potential failure mode identification of operational amplifier circuit board by using high accelerated limit test.
Microelectron. Reliab., 2018

2017
Nucleation and shrinkage of defects on the surface of tin induced by local strain distribution.
Microelectron. Reliab., 2017

Finite element analysis of thermal and mechanical stresses due to the grain anisotropy of polycrystalline β-Sn.
Microelectron. Reliab., 2017

2016
A reliability assessment guide for the transition planning to lead-free electronics for companies whose products are RoHS exempted or excluded.
Microelectron. Reliab., 2016

A fusion prognostics-based qualification test methodology for microelectronic products.
Microelectron. Reliab., 2016

Curvature sensitive analysis of axially compressed cylindrical tubes with corrugated surface using isogeometric analysis and experiment.
Comput. Aided Geom. Des., 2016

IoT-Based Prognostics and Systems Health Management for Industrial Applications.
IEEE Access, 2016

2012
Precursor monitoring approach for reliability assessment of cooling fans.
J. Intell. Manuf., 2012

Topologically robust B-spline surface reconstruction from point clouds using level set methods and iterative geometric fitting algorithms.
Comput. Aided Geom. Des., 2012

2008
Effect of process-induced voids on isothermal fatigue resistance of CSP lead-free solder joints.
Microelectron. Reliab., 2008

Pressure-induced tin whisker formation.
Microelectron. Reliab., 2008

Key reliability concerns with lead-free connectors.
Microelectron. Reliab., 2008

Effect of Creep Properties on Pressure Induced Tin Whisker Formation.
Proceedings of the Second International Conference on Secure System Integration and Reliability Improvement, 2008


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