T. Riehle

According to our database, T. Riehle authored at least 2 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2024

Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET.

Balaji Narasimham, A-R. Montoya, C. Paone, T. Riehle, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs.

Balaji Narasimham, H. Luk, C. Paone, A-R. Montoya, T. Riehle, Mike Smith, Liming Tsau

Proceedings of the IEEE International Reliability Physics Symposium, 2023