T. Gebel

According to our database, T. Gebel authored at least 1 paper in 2002.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2002

Charge trapping and degradation in Ge⁺ ion implanted SiO₂ layers during high-field electron injection.

A. N. Nazarov, I. N. Osiyuk, V. S. Lysenko, T. Gebel, Lars Rebohle, W. Skorupa

Microelectron. Reliab., 2002