Sylvain Dudit

According to our database, Sylvain Dudit authored at least 10 papers between 2004 and 2011.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2011

Failure analysis defect location on a real case 55 nm memory using dynamic power supply emulation.

Thierry Parrassin, Guillaume Celi, Sylvain Dudit, Michel Vallet

Microelectron. Reliab., 2011

Reliability impact due to high current, lattice and hot carriers temperatures on β^(2×2) matrix ESD power devices for advanced CMOS technologies.

Philippe Galy, J. Bourgeat, Jean Jimenez, Blaise Jacquier, D. Marin-Cudraz, Sylvain Dudit

Microelectron. Reliab., 2011

LVI detection on passive structure in advance CMOS technology: New opportunities for device analysis.

Guillaume Celi, Sylvain Dudit, Thierry Parrassin, Philippe Perdu, Antoine Reverdy, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2011

Time Resolved Imaging: From logical states to events, a new and efficient pattern matching method for VLSI analysis.

Guillaume Bascoul, Philippe Perdu, A. Benigni, Sylvain Dudit, Guillaume Celi, Dean Lewis

Microelectron. Reliab., 2011

2010

VLSI functional analysis by dynamic emission microscopy.

Philippe Perdu, Jerome Di-Battista, Sylvain Dudit, Tomonori Nakamura

Microelectron. Reliab., 2010

Inventory of silicon signatures induced by CDM event on deep sub-micronic CMOS-BICMOS technologies.

Philippe Galy, Sylvain Dudit, Michel Vallet, Ph. Larre, M. Bilinski, E. Petit, J. Beltritti, A. Dray, Jean Jimenez, Frank Jezequel, R. Chevallier, C. Boutonnat, V. Varo

Microelectron. Reliab., 2010

Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below).

Guillaume Celi, Sylvain Dudit, Philippe Perdu, Antoine Reverdy, Thierry Parrassin, Emmanuel Bechet, Dean Lewis, Michel Vallet

Microelectron. Reliab., 2010

2009

Impact and damage on deep sub-micron CMOS technology induced by substrate current due to ESD stress.

Philippe Galy, Sylvain Dudit, Michel Vallet, Corinne Richier, Christophe Entringer, Frank Jezequel, E. Petit, J. Beltritti

Microelectron. Reliab., 2009

2005

Light Emission to Time Resolved Emission For IC Debug and Failure Analysis.

Mustapha Remmach, A. Pigozzi, Romain Desplats, Philippe Perdu, Dean Lewis, J. Noel, Sylvain Dudit

Microelectron. Reliab., 2005

2004

Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?

Mustapha Remmach, Romain Desplats, Philippe Perdu, J. P. Roux, Michel Vallet, Sylvain Dudit, P. Sardin, Dean Lewis

Microelectron. Reliab., 2004