Sylvain Clerc
According to our database1,
Sylvain Clerc
authored at least 31 papers
between 2008 and 2024.
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Bibliography
2024
Exploration of Low-Energy Floating-Point Flash Attention Mechanism for 18nm FD-SOI CMOS Integration at the Edge.
Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024
2023
Low-Power Event-Driven Spectrogram Extractor for Multiple Keyword Spotting: A proof of concept.
Proceedings of the 21st IEEE Interregional NEWCAS Conference, 2023
A 291nW Real-Time Event-Driven Spectrogram Extraction unit in 28nm FD-SOI CMOS for Keyword Spotting Application.
Proceedings of the 49th IEEE European Solid State Circuits Conference, 2023
2021
Circuit Monitoring Across Design Life-Cycle in 28nm FD-SOI and 40nm Bulk CMOS technologies.
Proceedings of the 47th ESSCIRC 2021, 2021
2020
Guest Editorial Special Section on the 45th IEEE European Solid-State Circuits Conference (ESSCIRC).
IEEE J. Solid State Circuits, 2020
A 3.0μW@5fps QQVGA Self-Controlled Wake-Up Imager with On-Chip Motion Detection, Auto-Exposure and Object Recognition.
Proceedings of the IEEE Symposium on VLSI Circuits, 2020
A Performance-Flexible Energy-Optimized Automotive-Grade Cortex-R4F SoC through Combined AVS/ABB/Bias-in-Memory-Array Closed-Loop Regulation in 28nm FD-SOI.
Proceedings of the IEEE Symposium on VLSI Circuits, 2020
2019
Comparative evaluation of Body Biasing and Voltage Scaling for Low-Power Design on 28nm UTBB FD-SOI Technology.
Proceedings of the 2019 IEEE/ACM International Symposium on Low Power Electronics and Design, 2019
28nm FDSOI Platform with Embedded PCM for IoT, ULP, Digital, Analog, Automotive and others Applications.
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2017
A 0.40pJ/cycle 981 μm<sup>2</sup> voltage scalable digital frequency generator for SoC clocking.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2017
2016
A 28nm FD-SOI standard cell 0.6-1.2V open-loop frequency multiplier for low power SoC clocking.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
30% static power improvement on ARM Cortex<sup>®</sup>-A53 using static biasing-anticipation.
Proceedings of the ESSCIRC Conference 2016: 42<sup>nd</sup> European Solid-State Circuits Conference, 2016
On-chip supply power measurement and waveform reconstruction in a 28nm FD-SOI processor SoC.
Proceedings of the IEEE Asian Solid-State Circuits Conference, 2016
2015
IEEE J. Solid State Circuits, 2015
8.4 A 0.33V/-40°C process/temperature closed-loop compensation SoC embedding all-digital clock multiplier and DC-DC converter exploiting FDSOI 28nm back-gate biasing.
Proceedings of the 2015 IEEE International Solid-State Circuits Conference, 2015
Design and performance parameters of an ultra-low voltage, single supply 32bit processor implemented in 28nm FDSOI technology.
Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015
Frequency and voltage effects on SER on a 65nm Sparc-V8 microprocessor under radiation test.
Proceedings of the IEEE International Reliability Physics Symposium, 2015
28nm FD-SOI technology and design platform for sub-10pJ/cycle and SER-immune 32bits processors.
Proceedings of the ESSCIRC Conference 2015, 2015
2014
Particle Monte Carlo modeling of single-event transient current and charge collection in integrated circuits.
Microelectron. Reliab., 2014
IEEE J. Solid State Circuits, 2014
Proceedings of the 2014 IEEE International Conference on Solid-State Circuits Conference, 2014
2013
Proceedings of the ESSCIRC 2013, 2013
Proceedings of the Design, Automation and Test in Europe, 2013
2012
A 0.32V, 55fJ per bit access energy, CMOS 65nm bit-interleaved SRAM with radiation Soft Error tolerance.
Proceedings of the IEEE International Conference on IC Design & Technology, 2012
A 65nm SRAM achieving 250mV retention and 350mV, 1MHz, 55fJ/bit access energy, with bit-interleaved radiation Soft Error tolerance.
Proceedings of the 38th European Solid-State Circuit conference, 2012
28nm CMOS, energy efficient and variability tolerant, 350mV-to-1.0V, 10MHz/700MHz, 252bits frame error-decoder.
Proceedings of the 38th European Solid-State Circuit conference, 2012
2011
ACM Trans. Design Autom. Electr. Syst., 2011
A 240mV 1MHz, 340mV 10MHz, 40nm CMOS, 252 bits frame decoder using ultra-low voltage circuit design platform.
Proceedings of the 18th IEEE International Conference on Electronics, Circuits and Systems, 2011
2010
A 40nm CMOS 260kb SRAM-bitcell on-chip failure monitoring test scribe with integer-to-current converter.
Proceedings of the 36th European Solid-State Circuits Conference, 2010
2009
Proceedings of the 2009 International Symposium on Low Power Electronics and Design, 2009
2008
Proceedings of the ESSCIRC 2008, 2008