Susann Rothe

Orcid: 0000-0002-7238-1506

According to our database1, Susann Rothe authored at least 4 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Article 
PhD thesis 
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Links

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Bibliography

2024
Stress-based Electromigration Modeling in IC Design: Moving from Theory to Practice.
Proceedings of the 20th International Conference on Synthesis, 2024

2023
Combined Modeling of Electromigration, Thermal and Stress Migration in AC Interconnect Lines.
Proceedings of the 2023 International Symposium on Physical Design, 2023

2022
Reliability by Design: Avoiding Migration-Induced Failure in IC Interconnects.
Proceedings of the 35th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2022

2021
Toward Security Closure in the Face of Reliability Effects ICCAD Special Session Paper.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021


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