Suriyaprakash Natarajan

According to our database1, Suriyaprakash Natarajan authored at least 54 papers between 1998 and 2024.

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Bibliography

2024
DiagNNose: Toward Error Localization in Deep Learning Hardware-Based on VTA-TVM Stack.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., January, 2024

Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning.
CoRR, 2024

Structural Built In Self Test of Analog Circuits using ON/OFF Keying and Delay Monitors.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Generating Storage-Aware Test Sets Targeting Several Fault Models.
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

Graph Learning-based Fault Criticality Analysis for Enhancing Functional Safety of E/E Systems.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024

2023
Trouble-Shooting at GAN Point: Improving Functional Safety in Deep Learning Accelerators.
IEEE Trans. Computers, August, 2023

A Novel Low-Power Compression Scheme for Systolic Array-Based Deep Learning Accelerators.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., April, 2023

Analysis and Mitigation of DRAM Faults in Sparse-DNN Accelerators.
IEEE Des. Test, April, 2023

Enhanced ML-Based Approach for Functional Safety Improvement in Automotive AMS Circuits.
Proceedings of the IEEE International Test Conference, 2023

2022
DEFCON: Defect Acceleration through Content Optimization.
Proceedings of the IEEE International Test Conference, 2022

A defect tolerance framework for improving yield.
Proceedings of the DAC '22: 59th ACM/IEEE Design Automation Conference, San Francisco, California, USA, July 10, 2022

Using Fault Detection Tests to Produce Diagnostic Tests Targeting Large Sets of Candidate Faults.
Proceedings of the IEEE 31st Asian Test Symposium, 2022

2021
Toward Functional Safety of Systolic Array-Based Deep Learning Hardware Accelerators.
IEEE Trans. Very Large Scale Integr. Syst., 2021

Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts.
Proceedings of the 39th IEEE VLSI Test Symposium, 2021

HardCompress: A Novel Hardware-based Low-power Compression Scheme for DNN Accelerators.
Proceedings of the 22nd International Symposium on Quality Electronic Design, 2021

2020
Automated Design For Yield Through Defect Tolerance.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Automating Design For Yield: Silicon Learning to Predictive Models and Design Optimization.
Proceedings of the IEEE International Test Conference, 2020

SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.
Proceedings of the IEEE International Test Conference, 2020

2019
Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology.
Proceedings of the IEEE International Test Conference, 2019

2017
A novel test compression algorithm for analog circuits to decrease production costs.
Integr., 2017

Innovative practices session 3C hardware security.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Innovative practices session 4C data analytics in test.
Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2016
Analysis of Defects and Variations in Embedded Spin Transfer Torque (STT) MRAM Arrays.
IEEE J. Emerg. Sel. Topics Circuits Syst., 2016

Session 4B - Panel data analytics in semiconductor manufacturing.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Infant mortality tests for analog and mixed-signal circuits.
Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Fault simulation for analog test coverage.
Proceedings of the 2016 IEEE International Test Conference, 2016

Every test makes a difference: Compressing analog tests to decrease production costs.
Proceedings of the 21st Asia and South Pacific Design Automation Conference, 2016

2015
Innovative practices session 7C: Mixed signal test and debug.
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Special session 12B: Panel: IOT - Reliable? Secure? Or death by a billion cuts?
Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Identifying DC bias conditions for maximum DC current in digitally-assisted analog design.
Proceedings of the 2015 IEEE International Conference on Electronics, 2015

Fast eye diagram analysis for high-speed CMOS circuits.
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

A Model Study of Defects and Faults in Embedded Spin Transfer Torque (STT) MRAM Arrays.
Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014
Hot topic session 9C: Test and fault tolerance for emerging memory technologies.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Innovative practices session 4C: Disruptive solutions in the non-digital world.
Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

Spatio-temporal wafer-level correlation modeling with progressive sampling: A pathway to HVM yield estimation.
Proceedings of the 2014 International Test Conference, 2014

2013
Special session 12B: Panel post-silicon validation & test in huge variance era.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Innovative practices session 5C: Cloud atlas - Unreliability through massive connectivity.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013

Framework for analog test coverage.
Proceedings of the International Symposium on Quality Electronic Design, 2013

Scalable and efficient analog parametric fault identification.
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013

2011
The bang for the buck with resiliency: Yield or field?
Proceedings of the 29th IEEE VLSI Test Symposium, 2011

The buck stops with wafer test: Dream or reality?
Proceedings of the 29th IEEE VLSI Test Symposium, 2011

2010
Innovative practices session 9C: Implications of power delivery network for validation and testing.
Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Path coverage based functional test generation for processor marginality validation.
Proceedings of the 2011 IEEE International Test Conference, 2010

2008
Case Study on Speed Failure Causes in a Microprocessor.
IEEE Des. Test Comput., 2008

On Accelerating Path Delay Fault Simulation of Long Test Sequences.
Proceedings of the 2008 IEEE International Test Conference, 2008

On efficient generation of instruction sequences to test for delay defects in a processor.
Proceedings of the 18th ACM Great Lakes Symposium on VLSI 2008, 2008

2007
The Region-Exhaustive Fault Model.
Proceedings of the 16th Asian Test Symposium, 2007

2006
Path Delay Fault Simulation on Large Industrial Designs.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Selecting High-Quality Delay Tests for Manufacturing Test and Debug.
Proceedings of the 21th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2006), 2006

2005
Untestable Multi-Cycle Path Delay Faults in Industrial Designs.
Proceedings of the 14th Asian Test Symposium (ATS 2005), 2005

2002
XIDEN: Crosstalk Target Identification Framework.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001
Switch-level delay test of domino logic circuits.
Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999
Switch-level delay test.
Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998
Process Variations and their Impact on Circuit Operation.
Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998


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