Sunil K. Jain

According to our database, Sunil K. Jain authored at least 8 papers between 1983 and 2001.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2001

Testing beyond EPA: TDF methodology solutions matrix.

Sunil K. Jain, Greg P. Chema

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1986

Built-in Self Testing of Embedded Memories.

Sunil K. Jain, Charles E. Stroud

IEEE Des. Test, 1986

1985

Modeling and Test Generation Algorithms for MOS Circuits.

Sunil K. Jain, Vishwani D. Agrawal

IEEE Trans. Computers, 1985

Statistical Fault Analysis.

Sunil K. Jain, Vishwani D. Agrawal

IEEE Des. Test, 1985

1984

A gate level model for CMOS combinational logic circuits with application to fault detection.

Sudhakar M. Reddy, Vishwani D. Agrawal, Sunil K. Jain

Proceedings of the 21st Design Automation Conference, 1984

STAFAN: An alternative to fault simulation.

Sunil K. Jain, Vishwani D. Agrawal

Proceedings of the 21st Design Automation Conference, 1984

1983

Test strategy for microprocessers.

Sunil K. Jain, Alfred K. Susskind

Proceedings of the 20th Design Automation Conference, 1983

Test generation for MOS circuits using D-algorithm.

Sunil K. Jain, Vishwani D. Agrawal

Proceedings of the 20th Design Automation Conference, 1983