Sunhang Lee

According to our database1, Sunhang Lee authored at least 2 papers between 2022 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2024
Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022
Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022


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