Sunhang Lee
According to our database1,
Sunhang Lee
authored at least 2 papers
between 2022 and 2024.
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Bibliography
2024
Effect of Off-State Stress on Data-Valid Window Margin for Advanced DRAM Using HK/MG Process Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
2022
Transistor Reliability Characterization for Advanced DRAM with HK+MG & EUV process technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2022