Sungyoung Yoon

According to our database, Sungyoung Yoon authored at least 5 papers between 2009 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2021

Highly Reliable 28nm Embedded Flash Process Development for High-Density and High-Speed Automotive Grade-1 Application.

Jaehun Lee, Youngcheon Jeong, Kyongsik Yeom, Changmin Jeon, Jongsung Woo, Sangjin Lee, Ga-Young Lee, Dong-Hwee Hwang, Yong Seok Chung, Minji Seo, Dong-Hyun Kim, DalHwan Kim, Yongsik Kim, HyunChang Lee, Soomin Cho, MyeongHee Oh, Hyun-Jin Shin, Gun Rae Kim, Sungyoung Yoon, Yong Kyu Lee, Young Ki Hong

Proceedings of the IEEE International Memory Workshop, 2021

2020

Reliability of Industrial grade Embedded-STT-MRAM.

Yongsung Ji, Hyunjae Goo, Jungman Lim, Tae-Young Jeong, Taiki Uemura, Gun Rae Kim, Boil Seo, Seungbae Lee, Goeun Park, Jeongmin Jo, Sang-Il Han, Kilho Lee, Junghyuk Lee, Sohee Hwang, Daesop Lee, Suksoo Pyo, Hyun Taek Jung, Shinhee Han, Seungmo Noh, Kiseok Suh, Sungyoung Yoon, Hyeonwoo Nam, Hyewon Hwang, Hai Jiang, J. W. Kim, D. Kwon, Yoonjong Song, K. H. Koh, Hwasung Rhee, Sangwoo Pae, E. Lee

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Effects of Far-BEOL anneal on the WLR and product reliability characterization of FinFET process technology.

Hyun-Chul Sagong, Hyunjin Kim, Seungjin Choo, Sungyoung Yoon, Hyewon Shim, Sangsu Ha, Tae-Young Jeong, Minhyeok Choe, Junekyun Park, Sangchul Shin, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2009

A Usability Evaluation of Public Icon Interface.

Sungyoung Yoon, Jonghoon Seo, Joonyoung Yoon, Seungchul Shin, Tack-Don Han

Proceedings of the Human-Computer Interaction. New Trends, 13th International Conference, 2009

A Framework for Service Convergence via Device Cooperation.

Seungchul Shin, Do-Yoon Kim, Sungyoung Yoon

Proceedings of the Universal Access in Human-Computer Interaction. Intelligent and Ubiquitous Interaction Environments, 2009