Sungju Park

According to our database, Sungju Park authored at least 45 papers between 1990 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators.

Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2022

Highly Efficient Test Architecture for Low-Power AI Accelerators.

Muhammad Ibtesam, Umair Saeed Solangi, Jinuk Kim, Muhammad Adil Ansari, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022

2021

Time multiplexed LBIST for in-field testing of automotive AI accelerators.

Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park

IEICE Electron. Express, 2021

Master-slave based test cost reduction method for DNN accelerators.

Umair Saeed Solangi, Muhammad Ibtesam, Sungju Park

IEICE Electron. Express, 2021

Test Architecture for Systolic Array of Edge-Based AI Accelerator.

Umair Saeed Solangi, Muhammad Ibtesam, Muhammad Adil Ansari, Jinuk Kim, Sungju Park

IEEE Access, 2021

2020

CAN-Based Aging Monitoring Technique for Automotive ASICs With Efficient Soft Error Resilience.

Jinuk Kim, Muhammad Ibtesam, Dooyoung Kim, Jihun Jung, Sungju Park

IEEE Access, 2020

2018

Erratum to "Time-Multiplexed-Network for Test Cost Reduction".

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

Time-Multiplexed 1687-Network for Test Cost Reduction.

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017

On Diagnosing the Aging Level of Automotive Semiconductor Devices.

Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2017

2016

Time-multiplexed test access architecture for stacked integrated circuits.

Muhammad Adil Ansari, Jihun Jung, Dooyoung Kim, Sungju Park

IEICE Electron. Express, 2016

2015

Efficient diagnosis technique for aging defects on automotive semiconductor chips.

Jihun Jung, Muhammad Adil Ansari, Dooyoung Kim, Hyunbean Yi, Sungju Park

Proceedings of the 20th IEEE European Test Symposium, 2015

Scan-Puf: Puf Elements Selection Methods for Viable IC Identification.

Dooyoung Kim, Muhammad Adil Ansari, Jihun Jung, Sungju Park

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory.

Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park

IEEE Trans. Computers, 2014

2012

Characterizing the Capacitive Crosstalk in SRAM Cells Using Negative Bit-Line Voltage Stress.

Jongsun Bae, Sanghyeon Baeg, Sungju Park

IEEE Trans. Instrum. Meas., 2012

2011

Efficient Use of Unused Spare Columns to Improve Memory Error Correcting Rate.

Umair Ishaq, Jihun Jung, Jaehoon Song, Sungju Park

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

On-Chip Support for NoC-Based SoC Debugging.

Hyunbean Yi, Sungju Park, Sandip Kundu

IEEE Trans. Circuits Syst. I Regul. Pap., 2010

A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains.

Hyunbean Yi, Sandip Kundu, Sangwook Cho, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2010

A trial english class with a teaching assistant robot in elementary school.

Jeonghye Han, Seungmin Lee, Bokhyun Kang, Sungju Park, Jungkwan Kim, Myungsook Kim, Mihee Kim

Proceedings of the 5th ACM/IEEE International Conference on Human Robot Interaction, 2010

2009

An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge.

Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park

IEEE Trans. Circuits Syst. I Regul. Pap., 2009

Highly Compact Interconnect Test Patterns for Crosstalk and Static Faults.

Jaehoon Song, Juhee Han, Hyunbean Yi, Taejin Jung, Sungju Park

IEEE Trans. Circuits Syst. II Express Briefs, 2009

2008

Low-Cost Scan Test for IEEE-1500-Based SoC.

Hyunbean Yi, Jaehoon Song, Sungju Park

IEEE Trans. Instrum. Meas., 2008

Comparative study of effects of language instruction program using intelligence robot and multimedia on linguistic ability of young children.

Eun-ja Hyun, So-yeon Kim, Siekyung Jang, Sungju Park

Proceedings of the 17th IEEE International Symposium on Robot and Human Interactive Communication, 2008

An Efficient Secure Scan Design for an SoC Embedding AES Core.

Jaehoon Song, Taejin Jung, Junseop Lee, Hyeran Jeong, Byeongjin Kim, Sungju Park

Proceedings of the 2008 IEEE International Test Conference, 2008

A Design-for-Debug (DfD) for NoC-Based SoC Debugging via NoC.

Hyunbean Yi, Sungju Park, Sandip Kundu

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Design of Test Access Mechanism for AMBA-Based System-on-a-Chip.

Jaehoon Song, Piljae Min, Hyunbean Yi, Sungju Park

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Design Reuse of on/off-Chip Bus Bridge for Efficient Test Access to AMBA-based SoC.

Jaehoon Song, Juhee Han, Dooyoung Kim, Hyunbean Yi, Sungju Park

Proceedings of the 16th Asian Test Symposium, 2007

An Efficient Link Controller for Test Access to IP Core-Based Embedded System Chips.

Jaehoon Song, Hyunbean Yi, Juhee Han, Sungju Park

Proceedings of the Advances in Computer Systems Architecture, 2007

2006

Efficient Interconnect Test Patterns for Crosstalk and Static Faults.

Pyoungwoo Min, Hyunbean Yi, Jaehoon Song, Sanghyeon Baeg, Sungju Park

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains.

Hyunbean Yi, Jaehoon Song, Sungju Park

Proceedings of the 2006 IEEE International Test Conference, 2006

2005

Hybrid test data compression technique for SOC scan testing.

Sangwook Cho, Jaehoon Song, Hyunbean Yi, Sungju Park

Proceedings of the Proceedings 2005 IEEE International SOC Conference, 2005

The educational use of home robots for children.

Jeonghye Han, Miheon Jo, Sungju Park, Sungho Kim

Proceedings of the IEEE International Workshop on Robot and Human Interactive Communication, 2005

2004

A new state assignment technique for testing and low power.

Sungju Park, Sangwook Cho, Seiyang Yang, Maciej J. Ciesielski

Proceedings of the 41th Design Automation Conference, 2004

2003

An Efficient Buffer Allocation Technique for Virtual Lanes in InfiniBand Networks.

Hyunbean Yi, Sungju Park, Misook Kim, Kiman Jeon

Proceedings of the Web Communication Technologies and Internet-Related Social Issues, 2003

2002

A Genetic Algorithm for the Minimization of OPKFDDs.

Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2002

A New Boundary Matching Algorithm Based on Edge Detection.

NamRye Son, YoJin Yang, Gueesang Lee, Sungju Park

Proceedings of the EurAsia-ICT 2002: Information and Communication Technology, 2002

A Simple Wrapped Core Linking Module for SoC Test Access.

Jaehoon Song, Sungju Park

Proceedings of the 11th Asian Test Symposium (ATS 2002), 18-20 November 2002, Guam, USA, 2002

2001

Scalable data management using user-based caching and prefetching in distributed virtual environments.

Sungju Park, Dongman Lee, Mingyu Lim, Chansu Yu

Proceedings of the ACM Symposium on Virtual Reality Software and Technology, 2001

Minimization of OPKFDDs Using Genetic Algorithms.

Migyoung Jung, Gueesang Lee, Sungju Park, Rolf Drechsler

Proceedings of the Euromicro Symposium on Digital Systems Design 2001 (Euro-DSD 2001), 2001

A Microcode-Based Memory BIST Implementing Modified March Algorithm.

Dongkyu Youn, Taehyung Kim, Sungju Park

Proceedings of the 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan, 2001

2000

A partial scan design by unifying structural analysis and testabilities.

Jongwook Park, Sang-Hoon Shin, Sungju Park

Proceedings of the IEEE International Symposium on Circuits and Systems, 2000

A New IEEE 1149.1 Boundary Scan Design for the Detection of Delay Defects.

Sungju Park, Taehyung Kim

Proceedings of the 2000 Design, 2000

1996

A New Complete Diagnosis Patterns for Wiring Interconnects.

Sungju Park

Proceedings of the 33st Conference on Design Automation, 1996

1992

Parity bit calculation and test signal compaction for BIST applications.

Sungju Park, Sheldon B. Akers

J. Electron. Test., 1992

A Graph Theoretic Approach to Partial Scan Design by K-Cycle Elimination.

Sungju Park, Sheldon B. Akers

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990

Why is less information from logic simulation more useful in fault simulation?

Sheldon B. Akers Jr., Sungju Park, Balakrishnan Krishnamurthy, Ashok Swaminathan

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990