Sunghoon Chun

According to our database, Sunghoon Chun authored at least 15 papers between 2003 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

DiSC: A New Diagnosis Method for Multiple Scan Chain Failures.

Sunghoon Chun, Alex Orailoglu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

2009

ATPG-XP: Test Generation for Maximal Crosstalk-Induced Faults.

Sunghoon Chun, Taejin Kim, Sungho Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

A High-Level Signal Integrity Fault Model and Test Methodology for Long On-Chip Interconnections.

Sunghoon Chun, YongJoon Kim, Taejin Kim, Sungho Kang

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2008

An Effective Power Reduction Methodology for Deterministic BIST Using Auxiliary LFSR.

Myung-Hoon Yang, YongJoon Kim, Sunghoon Chun, Sungho Kang

J. Electron. Test., 2008

An Efficient Scan Chain Diagnosis Method Using a New Symbolic Simulation.

Sunghoon Chun, Taejin Kim, YongJoon Kim, Sungho Kang

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method.

Junghyun Nam, Sunghoon Chun, Gibum Koo, Yanggi Kim, Byungsoo Moon, Jonghyoung Lim, Jaehoon Joo, Sangseok Kang, Hoonjung Kim, Kyeongseon Shin, Kisang Kang, Sungho Kang

Proceedings of the 2008 IEEE International Test Conference, 2008

An Effective Hybrid Test Data Compression Method Using Scan Chain Compaction and Dictionary-Based Scheme.

Taejin Kim, Sunghoon Chun, YongJoon Kim, Myung-Hoon Yang, Sungho Kang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

XPDF-ATPG: An Efficient Test Pattern Generation for Crosstalk-Induced Faults.

Sunghoon Chun, YongJoon Kim, Taejin Kim, Myung-Hoon Yang, Sungho Kang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

A new low energy BIST using a statistical code.

Sunghoon Chun, Taejin Kim, Sungho Kang

Proceedings of the 13th Asia South Pacific Design Automation Conference, 2008

2007

MDSI: Signal Integrity Interconnect Fault Modeling and Testing for SoCs.

Sunghoon Chun, YongJoon Kim, Sungho Kang

J. Electron. Test., 2007

High-MDSI: A High-level Signal Integrity Fault Test Pattern Generation Method for Interconnects.

Sunghoon Chun, YongJoon Kim, Sungho Kang

Proceedings of the 16th Asian Test Symposium, 2007

2006

MICRO: a new hybrid test data compression/decompression scheme.

Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang

IEEE Trans. Very Large Scale Integr. Syst., 2006

An Efficient Dictionary Organization for Maximum Diagnosis.

Sunghoon Chun, Sangwook Kim, Hong-Sik Kim, Sungho Kang

J. Electron. Test., 2006

2004

RAIN (RAndom Insertion) Scheduling Algorithm for SoC Test.

Jung-Been Im, Sunghoon Chun, Geunbae Kim, Jin-Ho Ahn, Sungho Kang

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

A New Maximal Diagnosis Algorithm for Bus-structured Systems.

YongJoon Kim, DongSub Song, YongSeung Shin, Sunghoon Chun, Sungho Kang

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003