Sungbae Hwang

According to our database, Sungbae Hwang authored at least 6 papers between 2002 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Design for testability features of the SUN microsystems niagara2 CMP/CMT SPARC chip.

Robert F. Molyneaux, Thomas A. Ziaja, Hong Kim, Shahryar Aryani, Sungbae Hwang, Alex Hsieh

Proceedings of the 2007 IEEE International Test Conference, 2007

2003

Test data compression and test time reduction using an embedded microprocessor.

Sungbae Hwang, Jacob A. Abraham

IEEE Trans. Very Large Scale Integr. Syst., 2003

DSP-Based Statistical Self Test of On-Chip Converters.

Hak-soo Yu, Sungbae Hwang, Jacob A. Abraham

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Efficient loop-back testing of on-chip ADCs and DACs.

Hak-soo Yu, Jacob A. Abraham, Sungbae Hwang, Jeongjin Roh

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002

Optimal BIST Using an Embedded Microprocessor.

Sungbae Hwang, Jacob A. Abraham

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Selective-run built-in self-test using an embedded processor.

Sungbae Hwang, Jacob A. Abraham

Proceedings of the 12th ACM Great Lakes Symposium on VLSI 2002, 2002