Sung Ryul Kim

According to our database, Sung Ryul Kim authored at least 1 paper in 2020.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2020

Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology.

Heung-Kook Ko, Sena Park, Jihyun Ryu, Sung Ryul Kim, Giwon Lee, Dongjoon Lee, Sangwoo Pae, Euncheol Lee, Yongsun Ji, Hai Jiang, Taeyoung Jeong, Taiki Uemura, Dongkyun Kwon, Hyungrok Do, Hyungu Kahng, Yoon-Sang Cho, Jiyoon Lee, Seoung Bum Kim

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020