Sung-Boem Park

According to our database, Sung-Boem Park authored at least 11 papers between 2007 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2017

Test Generation Methods for Utilization Improvement of Hardware-Accelerated Simulation Platforms.

Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae-Cheol Son

IEEE Des. Test, 2017

2015

Comparative study of test generation methods for simulation accelerators.

Wisam Kadry, Dmitry Krestyashyn, Arkadiy Morgenshtein, Amir Nahir, Vitali Sokhin, Jin Sung Park, Sung-Boem Park, Wookyeong Jeong, Jae-Cheol Son

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2011

Robust System Design.

Subhasish Mitra, Hyungmin Cho, Ted Hong, Young Moon Kim, Hsiao-Heng Lee, Larkhoon Leem, Yanjing Li, David Lin, Evelyn Mintarno, Diana Mui, Sung-Boem Park, Nishant Patil, Hai Wei, Jie Zhang

IPSJ Trans. Syst. LSI Des. Methodol., 2011

2010

Post-silicon bug localization for processors using IFRA.

Sung-Boem Park, Subhasish Mitra

Commun. ACM, 2010

QED: Quick Error Detection tests for effective post-silicon validation.

Ted Hong, Yanjing Li, Sung-Boem Park, Diana Mui, David Lin, Ziyad Abdel Kaleq, Nagib Hakim, Helia Naeimi, Donald S. Gardner, Subhasish Mitra

Proceedings of the 2011 IEEE International Test Conference, 2010

BLoG: post-silicon bug localization in processors using bug localization graphs.

Sung-Boem Park, Anne Bracy, Hong Wang, Subhasish Mitra

Proceedings of the 47th Design Automation Conference, 2010

2009

Synthesis and Optimization of 2D Filter Designs for Heterogeneous FPGAs.

Christos-Savvas Bouganis, Sung-Boem Park, George A. Constantinides, Peter Y. K. Cheung

ACM Trans. Reconfigurable Technol. Syst., 2009

Post-Silicon Bug Localization in Processors Using Instruction Footprint Recording and Analysis (IFRA).

Sung-Boem Park, Ted Hong, Subhasish Mitra

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

IFRA: Post-silicon bug localization in processors.

Sung-Boem Park, Subhasish Mitra

Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2009

2008

IFRA: instruction footprint recording and analysis for post-silicon bug localization in processors.

Sung-Boem Park, Subhasish Mitra

Proceedings of the 45th Design Automation Conference, 2008

2007

Register pointer architecture for efficient embedded processors.

JongSoo Park, Sung-Boem Park, James D. Balfour, David Black-Schaffer, Christos Kozyrakis, William J. Dally

Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007