Summer F. C. Tseng

According to our database, Summer F. C. Tseng authored at least 3 papers between 2003 and 2004.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2004

Some practical considerations for effective and efficient wafer-level reliability control.

Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai

Microelectron. Reliab., 2004

2003

A cost-effective wafer-level reliability test system for integrated circuit makers.

Summer Fan-Chung Tseng, Wei-Ting Kary Chien, Excimer Gong, Bing-Chu Cai

IEEE Trans. Instrum. Meas., 2003

Improvement of poly-silicon hole induced gate oxide failure by silicon rich oxidation.

Summer F. C. Tseng, Wei-Ting Kary Chien, Bing-Chu Cai

Microelectron. Reliab., 2003