Sujit T. Zachariah

According to our database, Sujit T. Zachariah authored at least 15 papers between 1999 and 2006.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2006

Test Pattern Generation for Power Supply Droop Faults.

Debasis Mitra, Subhasis Bhattacharjee, Susmita Sur-Kolay, Bhargab B. Bhattacharya, Sujit T. Zachariah, Sandip Kundu

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

2005

On modeling crosstalk faults.

Sandip Kundu, Sujit T. Zachariah, Yi-Shing Chang, Chandra Tirumurti

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

Logic proximity bridges.

Eric N. Tran, Vamsee Krishna, Sujit T. Zachariah, Sreejit Chakravarty

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

Extraction of two-node bridges from large industrial circuits.

Sujit T. Zachariah, Sreejit Chakravarty

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

Physical Design Trends and Layout-Based Fault Modeling.

Susmita Sur-Kolay, Parthasarathi Dasgupta, Bhargab B. Bhattacharya, Sujit T. Zachariah

Proceedings of the 17th International Conference on VLSI Design (VLSI Design 2004), 2004

2003

Algorithm to extract two-node bridges.

Sujit T. Zachariah, Sreejit Chakravarty

IEEE Trans. Very Large Scale Integr. Syst., 2003

On Modeling Cross-Talk Faults.

Sujit T. Zachariah, Yi-Shing Chang, Sandip Kundu, Chandra Tirumurti

Proceedings of the 2003 Design, 2003

2002

Layout Analysis to Extract Open Nets Caused by Systematic Failure Mechanisms.

Sreejit Chakravarty, Kambiz Komeyli, Eric W. Savage, Michael J. Carruthers, Bret T. Stastny, Sujit T. Zachariah

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Experimental Evaluation of Scan Tests for Bridges.

Sreejit Chakravarty, Ankur Jain, Nandakumar Radhakrishnan, Eric W. Savage, Sujit T. Zachariah

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Test Challenges in Nanometer Technologies.

Sandip Kundu, Sujit T. Zachariah, Sanjay Sengupta, Rajesh Galivanche

J. Electron. Test., 2001

A Novel Algorithm for Multi-Node Bridge Analysis of Large VLSI Circuits.

Sujit T. Zachariah, Sreejit Chakravarty

Proceedings of the 14th International Conference on VLSI Design (VLSI Design 2001), 2001

2000

STBM: a fast algorithm to simulate I_DDQ tests forleakage faults.

Sreejit Chakravarty, Sujit T. Zachariah

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

A scalable and efficient methodology to extract two node bridges from large industrial circuits.

Sujit T. Zachariah, Sreejit Chakravarty

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

A novel algorithm to extract two-node bridges.

Sujit T. Zachariah, Sreejit Chakravarty, Carl D. Roth

Proceedings of the 37th Conference on Design Automation, 2000

1999

A Comparative Study of Pseudo Stuck-At and Leakage Fault Model.

Sujit T. Zachariah, Sreejit Chakravarty

Proceedings of the 12th International Conference on VLSI Design (VLSI Design 1999), 1999