Sujay Pandey

According to our database, Sujay Pandey authored at least 10 papers between 2016 and 2022.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2022

Hierarchical Test Generation for Open and Short Circuitdefect Exposure: a Systematic Methodology.

Sujay Pandey

PhD thesis, 2022

2021

Two Pattern Timing Tests Capturing Defect-Induced Multi-Gate Delay Impact of Shorts.

Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

2020

SAT-ATPG Generated Multi-Pattern Scan Tests for Cell Internal Defects: Coverage Analysis for Resistive Opens and Shorts.

Sujay Pandey, Zhiwei Liao, Shreyas Nandi, Sanya Gupta, Suriyaprakash Natarajan, Arani Sinha, Adit D. Singh, Abhijit Chatterjee

Proceedings of the IEEE International Test Conference, 2020

2019

Characterization of Library Cells for Open-circuit Defect Exposure: A Systematic Methodology.

Sujay Pandey, Sanya Gupta, Madhu Sudhan L., Suriya Natarajan, Arani Sinha, Abhijit Chatterjee

Proceedings of the IEEE International Test Conference, 2019

2018

Error Resilient Neuromorphic Networks Using Checker Neurons.

Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Cross-Layer Control Adaptation for Autonomous System Resilience.

Md Imran Momtaz, Suvadeep Banerjee, Sujay Pandey, Jacob A. Abraham, Abhijit Chatterjee

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

ReiNN: Efficient error resilience in artificial neural networks using encoded consistency checks.

Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee

Proceedings of the 23rd IEEE European Test Symposium, 2018

2017

DFM-aware fault model and ATPG for intra-cell and inter-cell defects.

Arani Sinha, Sujay Pandey, Ayush Singhal, Alodeep Sanyal, Alan Schmaltz

Proceedings of the IEEE International Test Conference, 2017

2016

Concurrent error detection and tolerance in Kalman filters using encoded state and statistical covariance checks.

Sujay Pandey, Suvadeep Banerjee, Abhijit Chatterjee

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Noise-Resilient SRAM Physically Unclonable Function Design for Security.

Sujay Pandey, Sabyasachi Deyati, Adit D. Singh, Abhijit Chatterjee

Proceedings of the 25th IEEE Asian Test Symposium, 2016