Subarna Sinha

According to our database1, Subarna Sinha authored at least 23 papers between 2005 and 2017.

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Bibliography

2017
Improved Tangent Space-Based Distance Metric for Lithographic Hotspot Classification.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

2016
Deciphering cancer biology using boolean methods.
Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2016

2014
Fast and scalable parallel layout decomposition in double patterning lithography.
Integr., 2014

Comparative Improvement of Image Segmentation Performance with Graph Based Method over Watershed Transform Image Segmentation.
Proceedings of the Distributed Computing and Internet Technology, 2014

2013
Graph Coloring Problem Solution Using Modified Flocking Algorithm.
Proceedings of the Third International Conference on Soft Computing for Problem Solving, 2013

2012
A Hierarchy-Based Distributed Algorithm for Layout Geometry Operations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Accurate process-hotspot detection using critical design rule extraction.
Proceedings of the 49th Annual Design Automation Conference 2012, 2012

Improved tangent space based distance metric for accurate lithographic hotspot classification.
Proceedings of the 49th Annual Design Automation Conference 2012, 2012

2011
Automating Logic Transformations With Approximate SPFDs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011

A distributed algorithm for layout geometry operations.
Proceedings of the 48th Design Automation Conference, 2011

2010
Fixed-outline thermal-aware 3D floorplanning.
Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009
Sequential logic rectifications with approximate SPFDs.
Proceedings of the Design, Automation and Test in Europe, 2009

The road to 3D EDA tool readiness.
Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008
Efficient range pattern matching algorithm for process-hotspot detection.
IET Circuits Devices Syst., 2008

2007
Fast and Efficient Bright-Field AAPSM Conflict Detection and Correction.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007

A New Flexible Algorithm for Random Yield Improvement.
Proceedings of the 8th International Symposium on Quality of Electronic Design (ISQED 2007), 2007

Accurate detection for process-hotspots with vias and incomplete specification.
Proceedings of the 2007 International Conference on Computer-Aided Design, 2007

A methodology for fast and accurate yield factor estimation during global routing.
Proceedings of the 2007 International Conference on Computer-Aided Design, 2007

Model Based Layout Pattern Dependent Metal Filling Algorithm for Improved Chip Surface Uniformity in the Copper Process.
Proceedings of the 12th Conference on Asia South Pacific Design Automation, 2007

2006
Efficient process-hotspot detection using range pattern matching.
Proceedings of the 2006 International Conference on Computer-Aided Design, 2006

An IC manufacturing yield model considering intra-die variations.
Proceedings of the 43rd Design Automation Conference, 2006

2005
Fast and efficient phase conflict detection and correction in standard-cell layouts.
Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

Bright-Field AAPSM Conflict Detection and Correction.
Proceedings of the 2005 Design, 2005


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