Steven L. Wright

According to our database, Steven L. Wright authored at least 14 papers between 1998 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2008

3D chip-stacking technology with through-silicon vias and low-volume lead-free interconnections.

Katsuyuki Sakuma, Paul S. Andry, Cornelia K. Tsang, Steven L. Wright, Bing Dang, Chirag S. Patel, Bucknell C. Webb, J. Maria, Edmund J. Sprogis, S. K. Kang, Robert J. Polastre, Raymond R. Horton, John U. Knickerbocker

IBM J. Res. Dev., 2008

Three-dimensional silicon integration.

John U. Knickerbocker, Paul S. Andry, Bing Dang, Raymond R. Horton, Mario J. Interrante, Chirag S. Patel, Robert J. Polastre, Katsuyuki Sakuma, Ranjani Sirdeshmukh, Edmund J. Sprogis, Sri M. Sri-Jayantha, Antonio M. Stephens, Anna W. Topol, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright

IBM J. Res. Dev., 2008

3D chip stacking with C4 technology.

Bing Dang, Steven L. Wright, Paul S. Andry, Edmund J. Sprogis, Cornelia K. Tsang, M. John Interrante, Bucknell C. Webb, Robert J. Polastre, Raymond R. Horton, Chirag S. Patel, Arun Sharma, J. Zheng, Katsuyuki Sakuma, John U. Knickerbocker

IBM J. Res. Dev., 2008

Fabrication and characterization of robust through-silicon vias for silicon-carrier applications.

Paul S. Andry, Cornelia K. Tsang, Bucknell C. Webb, Edmund J. Sprogis, Steven L. Wright, Bing Dang, Dennis G. Manzer

IBM J. Res. Dev., 2008

2006

3-D Silicon Integration and Silicon Packaging Technology Using Silicon Through-Vias.

John U. Knickerbocker, Chirag S. Patel, Paul S. Andry, Cornelia K. Tsang, L. Paivikki Buchwalter, Edmund J. Sprogis, Hua Gan, Raymond R. Horton, Robert J. Polastre, Steven L. Wright, John M. Cotte

IEEE J. Solid State Circuits, 2006

2005

Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection.

John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang

IBM J. Res. Dev., 2005

Three dimensional silicon integration using fine pitch interconnection, silicon processing and silicon carrier packaging technology.

John U. Knickerbocker, Chirag S. Patel, Paul S. Andry, Cornelia K. Tsang, L. Paivikki Buchwalter, Edmund J. Sprogis, Hua Gan, Raymond R. Horton, Robert J. Polastre, Steven L. Wright, Christian D. Schuster, Christian W. Baks, Fuad E. Doany, Joanna Rosner, Steven Cordes

Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005

2004

Liquid-crystal displays for medical imaging: a discussion of monochrome versus color.

Steven L. Wright, Ehsan Samei

Proceedings of the Medical Imaging 2004: Visualization, 2004

2003

Multiple images viewable on twisted-nematic mode liquid-crystal displays.

Chai Wah Wu, Gerhard Thompson, Steven L. Wright

IEEE Signal Process. Lett., 2003

2000

Status of TFTLCD Color and Metrology.

Steven L. Wright, Kenneth C. Ho, Shui-Chih Alan Lien

Proceedings of the Eighth Color Imaging Conference: Color Science and Engineering Systems, 2000

Colorimetric Tolerances of Various Digital Image Displays.

Jason E. Gibson, Mark D. Fairchild, Steven L. Wright

Proceedings of the Eighth Color Imaging Conference: Color Science and Engineering Systems, 2000

1998

Active line repair for thin-film-transistor liquid crystal displays.

Steven L. Wright, Kevin W. Warren, Paul M. Alt, Raymond R. Horton, Chandrasekhar Narayanaswami, Paul F. Greier, Manabu Kodate

IBM J. Res. Dev., 1998

A 10.5-in.-diagonal SXGA active-matrix display.

Evan G. Colgan, Paul M. Alt, Robert L. Wisnieff, Peter M. Fryer, Eileen A. Galligan, William S. Graham, Paul F. Greier, Raymond R. Horton, Harold Ifill, Leslie C. Jenkins, Richard A. John, Richard I. Kaufman, Yue Kuo, Alphonso P. Lanzetta, Kenneth F. Latzko, Frank R. Libsch, Shui-Chih Alan Lien, Steven E. Millman, Robert W. Nywening, Robert J. Polastre, Carl G. Powell, Rick A. Rand, John J. Ritsko, Mary B. Rothwell, John L. Staples, Kevin W. Warren, John S. Wilson, Steven L. Wright

IBM J. Res. Dev., 1998

Image Quality Issues for High Resolution TFTLCDs.

Steven L. Wright, Robert W. Nywening, Steven E. Millman, James O. Larimer, Jennifer Gille, Jeff Luszcz

Proceedings of the 6th Color and Imaging Conference, 1998