Steve Butkovich

According to our database, Steve Butkovich authored at least 2 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2009

Boundary-scan adoption - an industry snapshot with emphasis on the semiconductor industry.

Philip B. Geiger, Steve Butkovich

Proceedings of the 2009 IEEE International Test Conference, 2009

2004

Production Test Effectiveness of Combined Automated Inspection and ICT Test Strategies.

Amit Verma, Charles Robinson, Steve Butkovich

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004