Stephen Ramey

According to our database1, Stephen Ramey authored at least 14 papers between 2015 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
Hot-Carrier Aging by Ultrafast Laser on 22FLL FinFET Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023
A Unified Aging Model Framework Capturing Device to Circuit Degradation for Advance Technology Nodes.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

A detailed comparison of various off-state breakdown methodologies for scaled Tri-gate technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

Reliability Studies on Advanced FinFET Transistors of the Intel 4 CMOS Technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022
Method to evaluate off-state breakdown in scaled Tri-gate technologies.
Proceedings of the IEEE International Reliability Physics Symposium, 2022

2020
Reliability Stressing Control Using Jacobian Feedback Kelvin Measurement on Intel Technologies.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Novel Re-configurable Circuits For Aging Characterization: Connecting Devices to Circuits.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Reliability Characterization for 12 V Application Using the 22FFL FinFET Technology.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Modeling Framework for Transistor Aging Playback in Advanced Technology Nodes.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020


2018
Transistor reliability characterization and modeling of the 22FFL FinFET technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

Reliability studies of a 10nm high-performance and low-power CMOS technology featuring 3rd generation FinFET and 5th generation HK/MG.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015
Transistor reliability variation correlation to threshold voltage.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

Transistor aging and reliability in 14nm tri-gate technology.
Proceedings of the IEEE International Reliability Physics Symposium, 2015


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