Stephane David-Grignot

According to our database, Stephane David-Grignot authored at least 10 papers between 2014 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

On-chip Generation of Sine-wave Summing Digital Signals: an Analytic Study Considering Implementation Constraints.

Stephane David-Grignot, Achraf Lamlih, Mohamed Moez Belhaj, Vincent Kerzerho, Florence Azaïs, Fabien Soulier, Philippe Freitas, Tristan Rouyer, Sylvain Bonhommeau, Serge Bernard

J. Electron. Test., 2018

Wideband Fully Differential Current Driver with Optimized Output Impedance for Bioimpedance Measurements.

Achraf Lamlih, Philippe Freitas, Stephane David-Grignot, Jérémie Salles, Vincent Kerzèrho, Fabien Soulier, Serge Bernard, Tristan Rouyer, Sylvain Bonhommeau

Proceedings of the IEEE International Symposium on Circuits and Systems, 2018

2016

Digital Embedded Test Instrument for On-Chip Phase Noise Testing of Analog/RF Integrated Circuits.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

J. Circuits Syst. Comput., 2016

SSB Phase Noise Evaluation of Analog/IF Signals on Standard Digital ATE.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

J. Electron. Test., 2016

2015

Phase Noise Testing of Analog/IF Signals Using Digital ATE: A New Post-Processing Algorithm for Extended Measurement Range.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

J. Electron. Test., 2015

A digital technique for the evaluation of SSB phase noise of analog/RF signals.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

Proceedings of the 16th Latin-American Test Symposium, 2015

A new technique for low-cost phase noise production testing from 1-bit signal acquisition.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 20th IEEE European Test Symposium, 2015

Embedded Test Instrument for On-Chip Phase Noise Evaluation of Analog/IF Signals.

Florence Azaïs, Stephane David-Grignot, Laurent Latorre, Francois Lefevre

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Phase noise measurement on IF analog signals using standard digital ATE resources.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the IEEE 12th International New Circuits and Systems Conference, 2014

Low-cost phase noise testing of complex RF ICs using standard digital ATE.

Stephane David-Grignot, Florence Azaïs, Laurent Latorre, Francois Lefevre

Proceedings of the 2014 International Test Conference, 2014