Stephan Beuven

According to our database, Stephan Beuven authored at least 1 paper in 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Latent defect detection in microcontroller embedded flash test using device stress and wordline outlier screening.

Andreas Kux, Rudolf Ullmann, Thomas Kern, Roland Strunz, Hanno Melzner, Stephan Beuven, Andreas Haase

Proceedings of the 2014 International Test Conference, 2014