Steffen Tarnick

According to our database, Steffen Tarnick authored at least 13 papers between 1992 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2010

Design of embedded constant weight code checkers based on averaging operations.

Steffen Tarnick

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2008

A Low-Cost Accumulator-Based Test Pattern Generation Architecture.

Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters.

Steffen Tarnick

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Embedded Borden 2-UED Code Checkers.

Steffen Tarnick

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2004

Single-Output Embedded Checkers for Systematic Unordered Codes.

Steffen Tarnick

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2003

A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers.

Steffen Tarnick

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes.

Steffen Tarnick

Proceedings of the 2003 Design, 2003

1999

Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Code.

Albrecht P. Stroele, Steffen Tarnick

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1998

Embedded self-testing checkers for low-cost arithmetic codes.

Steffen Tarnick, Albrecht P. Stroele

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1995

Data compression techniques for concurrent error detection and built-in self test.

Steffen Tarnick

PhD thesis, 1995

Pattern generation for a deterministic BIST scheme.

Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich

Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995

1994

Controllable self-checking checkers for conditional concurrent checking.

Steffen Tarnick

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1992

Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers.

Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992