Steffen Tarnick

According to our database, Steffen Tarnick authored at least 21 papers between 1992 and 2011.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2011

An Accumulator - Based Test-Per-Clock Scheme.

Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick

IEEE Trans. Very Large Scale Integr. Syst., 2011

2010

Design of embedded constant weight code checkers based on averaging operations.

Steffen Tarnick

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

2008

Self-Testing Embedded Borden <i>t</i> -UED Code Checkers for <i>t</i> = 2^<i>k</i> <i>q</i> - 1 with <i>q</i> = 2^<i>m</i> - 1.

Steffen Tarnick

J. Electron. Test., 2008

A Low-Cost Accumulator-Based Test Pattern Generation Architecture.

Dimitris Magos, Ioannis Voyiatzis, Steffen Tarnick

Proceedings of the 14th IEEE International On-Line Testing Symposium (IOLTS 2008), 2008

2007

Design of Embedded m-out-of-n Code Checkers Using Complete Parallel Counters.

Steffen Tarnick

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

2006

Embedded Borden 2-UED Code Checkers.

Steffen Tarnick

Proceedings of the 12th IEEE International On-Line Testing Symposium (IOLTS 2006), 2006

2005

Single- and Double-Output Embedded Checker Architectures for Systematic Unordered Codes.

Steffen Tarnick

J. Electron. Test., 2005

2004

Design of Embedded Self-Testing Checkers for <i>t</i>-UED and BUED Codes.

Steffen Tarnick

J. Electron. Test., 2004

Single-Output Embedded Checkers for Systematic Unordered Codes.

Steffen Tarnick

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2003

A Design Method for Embedded Self-Testing t-UED and BUED Code Checkers.

Steffen Tarnick

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

Self-Testing Embedded Checkers for Bose-Lin, Bose, and a Class of Borden Codes.

Steffen Tarnick

Proceedings of the 2003 Design, 2003

2000

Embedded Checker Architectures for Cyclic and Low-Cost Arithmetic Codes.

Albrecht P. Stroele, Steffen Tarnick

J. Electron. Test., 2000

1999

Programmable Embedded Self-Testing Checkers for All-Unidirectional Error-Detecting Code.

Albrecht P. Stroele, Steffen Tarnick

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1998

Embedded Parity and Two-Rail TSC Checkers with Error-Memorizing Capability.

Steffen Tarnick

VLSI Design, 1998

Embedded self-testing checkers for low-cost arithmetic codes.

Steffen Tarnick, Albrecht P. Stroele

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1996

Self-Checking Comparator with One Periodic Output.

Sandip Kundu, Egor S. Sogomonyan, Michael Gössel, Steffen Tarnick

IEEE Trans. Computers, 1996

1995

Data compression techniques for concurrent error detection and built-in self test.

Steffen Tarnick

PhD thesis, 1995

Controllable self-checking checkers for conditional concurrent checking.

Steffen Tarnick

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.

Sybille Hellebrand, Janusz Rajski, Steffen Tarnick, Srikanth Venkataraman, Bernard Courtois

IEEE Trans. Computers, 1995

Pattern generation for a deterministic BIST scheme.

Sybille Hellebrand, Birgit Reeb, Steffen Tarnick, Hans-Joachim Wunderlich

Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995

1992

Generation of Vector Patterns Through Reseeding of Multipe-Polynominal Linear Feedback Shift Registers.

Sybille Hellebrand, Steffen Tarnick, Bernard Courtois, Janusz Rajski

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992