Stefano Aresu

According to our database, Stefano Aresu authored at least 11 papers between 2002 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

28nm Data Memory with Embedded RRAM Technology in Automotive Microcontrollers.

Alessandro Grossi, Matteo Coppetta, Stefano Aresu, Andreas Kux, Thomas Kern, Robert Strenz

Proceedings of the IEEE International Memory Workshop, 2023

2014

HCS degradation of 5 nm oxide high-voltage PLDMOS.

C. Olk, Stefano Aresu, R. Rudolf, M. Röhner, Wolfgang Gustin, E. Stein Von Kamienski

Microelectron. Reliab., 2014

2012

New insights on the PBTI phenomena in SiON pMOSFETs.

Karina Rott, Hans Reisinger, Stefano Aresu, Christian Schlünder, Klaus Kölpin, Wolfgang Gustin, Tibor Grasser

Microelectron. Reliab., 2012

2008

Reduction of test effort. Looking for more acceleration for reliable components for automotive applications.

Reinhard Pufall, Werner Kanert, Stefano Aresu, Michael Goroll

Microelectron. Reliab., 2008

New aspects for lifetime prediction of bipolar transistors in automotive power wafer technologies by using a power law fitting procedure.

Michael Goroll, Reinhard Pufall, Stefano Aresu, Wolfgang Gustin

Microelectron. Reliab., 2008

NBTI on smart power technologies: A detailed analysis of two concurrent effects using a re-examined on-the-fly technique.

Stefano Aresu, Reinhard Pufall, Michael Goroll, Wolfgang Gustin

Microelectron. Reliab., 2008

2007

Analysis of ESD protection structure behaviour after ageing as new approach for system level reliability of automotive power devices.

Michael Goroll, Werner Kanert, Reinhard Pufall, Stefano Aresu

Microelectron. Reliab., 2007

Exceptional operative gate voltage induces negative bias temperature instability (NBTI) on n-type trench DMOS transistors.

Stefano Aresu, Werner Kanert, Reinhard Pufall, Michael Goroll

Microelectron. Reliab., 2007

2004

Evidence for source side injection hot carrier effects on lateral DMOS transistors.

Stefano Aresu, Ward De Ceuninck, Geert Van den Bosch, Guido Groeseneken, Peter Moens, Jean Manca, D. Wojciechowski, P. Gassot

Microelectron. Reliab., 2004

2003

A new method for the analysis of high-resolution SILC data.

Stefano Aresu, Ward De Ceuninck, G. Knuyt, J. Mertens, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger, Jan D'Haen

Microelectron. Reliab., 2003

2002

High-resolution SILC measurements of thin SiO₂ at ultra low voltages.

Stefano Aresu, Ward De Ceuninck, R. Dreesen, Kris Croes, E. Andries, Jean Manca, Luc De Schepper, Robin Degraeve, Ben Kaczer, Marc D'Olieslaeger

Microelectron. Reliab., 2002