Stefan Wiefels

According to our database, Stefan Wiefels authored at least 10 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Roadmap to Neuromorphic Computing with Emerging Technologies.

Adnan Mehonic, Daniele Ielmini, Kaushik Roy, Onur Mutlu, Shahar Kvatinsky, Teresa Serrano-Gotarredona, Bernabé Linares-Barranco, Sabina Spiga, Sergey Savelev, Alexander G. Balanov, Nitin Chawla, Giuseppe Desoli, Gerardo Malavena, Christian Monzio Compagnoni, Zhongrui Wang, J. Joshua Yang, Syed Ghazi Sarwat, Abu Sebastian, Thomas Mikolajick, Beatriz Noheda, Stefan Slesazeck, Bernard Dieny, Tuo-Hung Hou, Akhil Varri, Frank Brückerhoff-Plückelmann, Wolfram H. P. Pernice, Xixiang Zhang, Sebastian Pazos, Mario Lanza, Stefan Wiefels, Regina Dittmann, Wing H. Ng, Mark Buckwell, Horatio Cox, Daniel J. Mannion, Anthony J. Kenyon, Yingming Lu, Yuchao Yang, Damien Querlioz, Louis Hutin, Elisa Vianello, Sayeed Shafayet Chowdhury, Piergiulio Mannocci, Yimao Cai, Zhong Sun, Giacomo Pedretti, John Paul Strachan, Dmitri B. Strukov, Manuel Le Gallo, Stefano Ambrogio, Ilia Valov, Rainer Waser

CoRR, 2024

2023

A Physical Description of the Variability in Single-ReRAM Devices and Hardware-Based Neuronal Networks.

Carsten Funck, Stefan Wiefels, Christopher Bengel, Kristoffer Schnieders, Susanne Hoffmann-Eifert, Regina Dittmann, Stephan Menzel

Adv. Intell. Syst., November, 2023

Experimental Verification of Uncoupled Memristive Cellular Nonlinear Network by Processing the EDGE Detection Task.

Yongmin Wang, Kristoffer Schnieders, Vasileios G. Ntinas, Alon Ascoli, Felix Cüppers, Susanne Hoffmann-Eifert, Stefan Wiefels, Ronald Tetzlaff, Vikas Rana, Stephan Menzel

Proceedings of the 18th ACM International Symposium on Nanoscale Architectures, 2023

Impact of the switching mode on the read noise of ReRAM devices.

Kristoffer Schnieders, Stephan Aussen, Felix Cüppers, Susanne Hoffmann-Eifert, Stefan Wiefels

Proceedings of the 18th ACM International Symposium on Nanoscale Architectures, 2023

Advanced Electrical Characterization of Memristive Arrays for Neuromorphic Applications.

Stefan Wiefels, Xiaohua Liu, Kristoffer Schnieders, Mathias Schumacher, Rainer Waser, Lutz Nielen

Proceedings of the IEEE International Conference on Metrology for eXtended Reality, 2023

2022

Reliability aspects of binary vector-matrix-multiplications using ReRAM devices.

Christopher Bengel, Johannes Mohr, Stefan Wiefels, Abhairaj Singh, Anteneh Gebregiorgis, Rajendra Bishnoi, Said Hamdioui, Rainer Waser, Dirk J. Wouters, Stephan Menzel

Neuromorph. Comput. Eng., 2022

A Voltage-Controlled, Oscillation-Based ADC Design for Computation-in-Memory Architectures Using Emerging ReRAMs.

Mahta Mayahinia, Abhairaj Singh, Christopher Bengel, Stefan Wiefels, Muath Abu Lebdeh, Stephan Menzel, Dirk J. Wouters, Anteneh Gebregiorgis, Rajendra Bishnoi, Rajiv V. Joshi, Said Hamdioui

ACM J. Emerg. Technol. Comput. Syst., 2022

Endurance of 2 Mbit Based BEOL Integrated ReRAM.

Nils Kopperberg, Stefan Wiefels, Karl Hofmann, Jan Otterstedt, Dirk J. Wouters, Rainer Waser, Stephan Menzel

IEEE Access, 2022

Experimental and Theoretical Analysis of Stateful Logic in Passive and Active Crossbar Arrays for Computation-in-Memory.

Christopher Bengel, Stefan Wiefels, Vikas Rana, Hsin-Yu Chen, Qing-Tai Zhao, Rainer Waser, Henriette Padberg, Fengben Xi, Stephan Menzel

Proceedings of the IEEE International Symposium on Circuits and Systems, 2022

NEUROTEC I: Neuro-inspired Artificial Intelligence Technologies for the Electronics of the Future.

Melvin Galicia, Stephan Menzel, Farhad Merchant, Maximilian Müller, Hsin-Yu Chen, Qing-Tai Zhao, Felix Cüppers, Abdur R. Jalil, Qi Shu, Peter Schüffelgen, Gregor Mussler, Carsten Funck, Christian Lanius, Stefan Wiefels, Moritz von Witzleben, Christopher Bengel, Nils Kopperberg, Tobias Ziegler, R. Walied Ahmad, Alexander Krüger, Letícia Maria Bolzani Pöhls, Regina Dittmann, Susanne Hoffmann-Eifert, Vikas Rana, Detlev Grützmacher, Matthias Wuttig, Dirk J. Wouters, Andrei Vescan, Tobias Gemmeke, Joachim Knoch, Max Christian Lemme, Rainer Leupers, Rainer Waser

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022