Stefan van den Oetelaar

According to our database, Stefan van den Oetelaar authored at least 2 papers between 2002 and 2003.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2003

Detection of Resistive Shorts in Deep Sub-micron Technologies.

Bram Kruseman, Stefan van den Oetelaar

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Comparison of IDDQ Testing and Very-Low Voltage Testing.

Bram Kruseman, Stefan van den Oetelaar, Josep Rius

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002