Stefan Holst

According to our database, Stefan Holst authored at least 45 papers between 1999 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting.

Shiling Shi, Stefan Holst, Xiaoqing Wen

IEICE Trans. Inf. Syst., October, 2023

Stock price movement prediction based on Stocktwits investor sentiment using FinBERT and ensemble SVM.

Jin-Xian Liu, Jenq-Shiou Leu, Stefan Holst

PeerJ Comput. Sci., 2023

Mitigating Test-Induced Yield-Loss by IR-Drop-Aware X-Filling.

Shiling Shi, Stefan Holst, Xiaoqing Wen

Proceedings of the 16th IEEE International Symposium on Embedded Multicore/Many-core Systems-on-Chip, 2023

Exploiting the Error Resilience of the Preconditioned Conjugate Gradient Method for Energy and Delay Optimization.

Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich

Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

BiSTAHL: A Built-In Self-Testable Soft-Error-Hardened Scan-Cell.

Stefan Holst, Ruijun Ma, Xiaoqing Wen, Aibin Yan, Hui Xu

Proceedings of the IEEE European Test Symposium, 2023

Guardband Optimization for the Preconditioned Conjugate Gradient Algorithm.

Natalia Lylina, Stefan Holst, Hanieh Jafarzadeh, Alexandra Kourfali, Hans-Joachim Wunderlich

Proceedings of the 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2023

2022

Evaluation and Test of Production Defects in Hardened Latches.

Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu

IEICE Trans. Inf. Syst., 2022

Power and Energy Safe Real-Time Multi-Core Task Scheduling.

Kalyan Baital, Amlan Chakrabarti, Biswadeep Chatterjee, Stefan Holst, Xiaoqing Wen

Proceedings of the 35th International Conference on VLSI Design and 2022 21st International Conference on Embedded Systems, 2022

On the Impact of Hardware Timing Errors on Stochastic Computing based Neural Networks.

Florian Neugebauer, Stefan Holst, Ilia Polian

Proceedings of the IEEE European Test Symposium, 2022

2021

On the Efficacy of Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption.

Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian

IEICE Trans. Inf. Syst., 2021

GPU-Accelerated Timing Simulation of Systolic-Array-Based AI Accelerators.

Stefan Holst, Lim Bumun, Xiaoqing Wen

Proceedings of the 30th IEEE Asian Test Symposium, 2021

2020

Logic Fault Diagnosis of Hidden Delay Defects.

Stefan Holst, Matthias Kampmann, Alexander Sprenger, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich, Xiaoqing Wen

Proceedings of the IEEE International Test Conference, 2020

2019

Targeted Partial-Shift For Mitigating Shift Switching Activity Hot-Spots During Scan Test.

Stefan Holst, Shiling Shi, Xiaoqing Wen

Proceedings of the 24th IEEE Pacific Rim International Symposium on Dependable Computing, 2019

Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses.

Stefan Holst, Eric Schneider, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich

Proceedings of the IEEE International Test Conference, 2019

STAHL: A Novel Scan-Test-Aware Hardened Latch Design.

Ruijun Ma, Stefan Holst, Xiaoqing Wen, Aibin Yan, Hui Xu

Proceedings of the 24th IEEE European Test Symposium, 2019

A Fault-Tolerant MPSoC For CubeSats.

Christian M. Fuchs, Pai H. Chou, Xiaoqing Wen, Nadia M. Murillo, Gianluca Furano, Stefan Holst, Antonis Tavoularis, Shyue-Kung Lu, Aske Plaat, Kostas Marinis

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2018

The impact of production defects on the soft-error tolerance of hardened latches.

Stefan Holst, Ruijun Ma, Xiaoqing Wen

Proceedings of the 23rd IEEE European Test Symposium, 2018

Clock-Skew-Aware Scan Chain Grouping for Mitigating Shift Timing Failures in Low-Power Scan Testing.

Yucong Zhang, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Hans-Joachim Wunderlich, Jun Qian

Proceedings of the 27th IEEE Asian Test Symposium, 2018

2017

GPU-Accelerated Simulation of Small Delay Faults.

Eric Schneider, Michael A. Kochte, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Analysis and mitigation or IR-Drop induced scan shift-errors.

Stefan Holst, Eric Schneider, Koshi Kawagoe, Michael A. Kochte, Kohei Miyase, Hans-Joachim Wunderlich, Seiji Kajihara, Xiaoqing Wen

Proceedings of the IEEE International Test Conference, 2017

Scan Chain Grouping for Mitigating IR-Drop-Induced Test Data Corruption.

Yucong Zhang, Stefan Holst, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara, Jun Qian

Proceedings of the 26th IEEE Asian Test Symposium, 2017

2016

Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation.

Fuqiang Li, Xiaoqing Wen, Kohei Miyase, Stefan Holst, Seiji Kajihara

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2016

Timing-Accurate Estimation of IR-Drop Impact on Logic- and Clock-Paths During At-Speed Scan Test.

Stefan Holst, Eric Schneider, Xiaoqing Wen, Seiji Kajihara, Yuta Yamato, Hans-Joachim Wunderlich, Michael A. Kochte

Proceedings of the 25th IEEE Asian Test Symposium, 2016

Formal Test Point Insertion for Region-based Low-Capture-Power Compact At-Speed Scan Test.

Stephan Eggersglüß, Stefan Holst, Daniel Tille, Kohei Miyase, Xiaoqing Wen

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

High-Throughput Logic Timing Simulation on GPGPUs.

Stefan Holst, Michael E. Imhof, Hans-Joachim Wunderlich

ACM Trans. Design Autom. Electr. Syst., 2015

A soft-error tolerant TCAM using partial don't-care keys.

Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase

Proceedings of the 20th IEEE European Test Symposium, 2015

GPU-accelerated small delay fault simulation.

Eric Schneider, Stefan Holst, Michael A. Kochte, Xiaoqing Wen, Hans-Joachim Wunderlich

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

Logic/Clock-Path-Aware At-Speed Scan Test Generation for Avoiding False Capture Failures and Reducing Clock Stretch.

Koji Asada, Xiaoqing Wen, Stefan Holst, Kohei Miyase, Seiji Kajihara, Michael A. Kochte, Eric Schneider, Hans-Joachim Wunderlich, Jun Qian

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST.

Akihiro Tomita, Xiaoqing Wen, Yasuo Sato, Seiji Kajihara, Kohei Miyase, Stefan Holst, Patrick Girard, Mohammad Tehranipoor, Laung-Terng Wang

IEICE Trans. Inf. Syst., 2014

Data-parallel simulation for fast and accurate timing validation of CMOS circuits.

Eric Schneider, Stefan Holst, Xiaoqing Wen, Hans-Joachim Wunderlich

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Soft-error tolerant TCAMs for high-reliability packet classifications.

Infall Syafalni, Tsutomu Sasao, Xiaoqing Wen, Stefan Holst, Kohei Miyase

Proceedings of the 2014 IEEE Asia Pacific Conference on Circuits and Systems, 2014

2012

Efficient location-based logic diagnosis of digital circuits.

Stefan Holst

PhD thesis, 2012

Structural Test and Diagnosis for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

J. Electron. Test., 2012

Acceleration of Monte-Carlo molecular simulations on hybrid computing architectures.

Claus Braun, Stefan Holst, Hans-Joachim Wunderlich, Juan Manuel Castillo-Sanchez, Joachim Gross

Proceedings of the 30th International IEEE Conference on Computer Design, 2012

Scan Test Power Simulation on GPGPUs.

Stefan Holst, Eric Schneider, Hans-Joachim Wunderlich

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2011

Structural Test for Graceful Degradation of NoC Switches.

Atefe Dalirsani, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the 16th European Test Symposium, 2011

Embedded Test for Highly Accurate Defect Localization.

Abdullah Mumtaz, Michael E. Imhof, Stefan Holst, Hans-Joachim Wunderlich

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2009

Adaptive Debug and Diagnosis Without Fault Dictionaries.

Stefan Holst, Hans-Joachim Wunderlich

J. Electron. Test., 2009

Restrict Encoding for Mixed-Mode BIST.

Abdul Wahid Hakmi, Stefan Holst, Hans-Joachim Wunderlich, Jürgen Schlöffel, Friedrich Hapke, Andreas Glowatz

Proceedings of the 27th IEEE VLSI Test Symposium, 2009

Test Encoding for Extreme Response Compaction.

Michael A. Kochte, Stefan Holst, Melanie Elm, Hans-Joachim Wunderlich

Proceedings of the 14th IEEE European Test Symposium, 2009

A diagnosis algorithm for extreme space compaction.

Stefan Holst, Hans-Joachim Wunderlich

Proceedings of the Design, Automation and Test in Europe, 2009

2008

An a priori error estimate for a monotone mixed finite-element discretization of a convection-diffusion problem.

Stefan Holst

Numerische Mathematik, 2008

2004

An Adaptive Mixed Scheme for Energy-Transport Simulations of Field-Effect Transistors.

Stefan Holst, Ansgar Jüngel, Paola Pietra

SIAM J. Sci. Comput., 2004

2003

A Mixed Finite-Element Discretization of the Energy-Transport Model for Semiconductors.

Stefan Holst, Ansgar Jüngel, Paola Pietra

SIAM J. Sci. Comput., 2003

1999

Realization of an Agent-Based Certificate Authority and Key Distribution.

Karsten Bsufka, Stefan Holst, Torge Schmidt

Proceedings of the Intelligent Agents for Telecommunication Applications, 1999