Stefan Dilhaire

According to our database, Stefan Dilhaire authored at least 21 papers between 1999 and 2014.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2014

Electro-thermal characterization of a differential temperature sensor in a 65 nm CMOS IC: Applications to gain monitoring in RF amplifiers.

Josep Altet, José Luis González, Didac Gómez, Xavier Perpiñà, Wilfrid Claeys, Stéphane Grauby, Cédric Dufis, Miquel Vellvehí, Diego Mateo, Ferran Reverter, Stefan Dilhaire, Xavier Jordà

Microelectron. J., 2014

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.

Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2009

Joule expansion imaging techniques on microlectronic devices.

Stéphane Grauby, Luis David Patiño Lopez, M. Amine Salhi, Etienne Puyoo, Jean-Michel Rampnoux, Wilfrid Claeys, Stefan Dilhaire

Microelectron. J., 2009

2008

Comparison of thermoreflectance and scanning thermal microscopy for microelectronic device temperature variation imaging: Calibration and resolution issues.

Stéphane Grauby, M. Amine Salhi, Luis David Patiño Lopez, Wilfrid Claeys, Benoît Charlot, Stefan Dilhaire

Microelectron. Reliab., 2008

Using Temperature as Observable of the Frequency Response of RF CMOS Amplifiers.

Eduardo Aldrete-Vidrio, M. Amine Salhi, Josep Altet, Stéphane Grauby, Diego Mateo, H. Michel, L. Clerjaud, Jean-Michel Rampnoux, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire

Proceedings of the 13th European Test Symposium, 2008

2006

Dynamic Surface Temperature Measurements in ICs.

Josep Altet, Wilfrid Claeys, Stefan Dilhaire, Antonio Rubio

Proc. IEEE, 2006

Time gating imaging through thick silicon substrate: a new step towards backside characterisation.

Jean-Michel Rampnoux, H. Michel, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys, Stefan Dilhaire

Microelectron. Reliab., 2006

2005

ElectroStatic Discharge Fault Localization by Laser Probing.

Stéphane Grauby, M. Amine Salhi, Wilfrid Claeys, D. Trias, Stefan Dilhaire

Microelectron. Reliab., 2005

2004

Strain energy imaging of a power MOS transistor using speckle interferometry.

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Wilfrid Claeys

IEEE Trans. Reliab., 2004

Applications of temperature phase measurements to IC testing.

Josep Altet, Jean-Michel Rampnoux, Jean-Christophe Batsale, Stefan Dilhaire, Antonio Rubio, Wilfrid Claeys, Stéphane Grauby

Microelectron. Reliab., 2004

Characterization of the thermal behavior of PN thermoelectric couples by scanning thermal microscope.

Luis David Patiño Lopez, Stéphane Grauby, Stefan Dilhaire, M. Amine Salhi, Wilfrid Claeys, Stéphane Lefèvre, Sebastian Volz

Microelectron. J., 2004

Thermal parameters identification of micrometric layers of microelectronic devices by thermoreflectance microscopy.

Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys, Jean-Christophe Batsale

Microelectron. J., 2004

Sensing temperature in CMOS circuits for Thermal Testing.

Josep Altet, Antonio Rubio, M. Amine Salhi, Jose Luis Gálvez, Stefan Dilhaire, Ashish Syal, André Ivanov

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

2003

Determination of passive SiO₂-Au microstructure resonant frequencies.

Guillaume Marinier, Stefan Dilhaire, Luis David Patiño Lopez, Mohamed Benzohra

Microelectron. Reliab., 2003

Laser Seebeck Effect Imaging (SEI) and Peltier Effect Imaging (PEI): complementary investigation methods.

Stefan Dilhaire, M. Amine Salhi, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

Application of Picosecond Ultrasonics to Non-Destructive Analysis in VLSI circuits.

G. Andriamonje, Vincent Pouget, Yves Ousten, Dean Lewis, Yves Danto, Jean-Michel Rampnoux, Younès Ezzahri, Stefan Dilhaire, Stéphane Grauby, Wilfrid Claeys

Microelectron. Reliab., 2003

2001

Laser diode COFD analysis by thermoreflectance microscopy.

Stefan Dilhaire, Stéphane Grauby, Sébastien Jorez, Luis David Patiño Lopez, Emmanuel Schaub, Wilfrid Claeys

Microelectron. Reliab., 2001

Thermal coupling in integrated circuits: application to thermal testing.

Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys

IEEE J. Solid State Circuits, 2001

2000

Thermal Testing: Fault Location Strategies.

Josep Altet, Antonio Rubio, Emmanuel Schaub, Stefan Dilhaire, Wilfrid Claeys

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

1999

Temperature measurements of metal lines under current stress by high-resolution laser probing.

Véronique Quintard, Stefan Dilhaire, Tam Phan, Wilfrid Claeys

IEEE Trans. Instrum. Meas., 1999

Differential Thermal Testing: An Approach to its Feasibility.

Josep Altet, Antonio Rubio, Wilfrid Claeys, Stefan Dilhaire, Emmanuel Schaub, Hideo Tamamoto

J. Electron. Test., 1999