Stefan De Gendt

According to our database, Stefan De Gendt authored at least 19 papers between 1999 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Exploring Machine Learning for Semiconductor Process Optimization: A Systematic Review.

Ying-Lin Chen, Sara Sacchi, Bappaditya Dey, Víctor Blanco, Sandip Halder, Philippe Leray, Stefan De Gendt

IEEE Trans. Artif. Intell., December, 2024

Advancing SEM Based Nano-Scale Defect Analysis in Semiconductor Manufacturing for Advanced IC Nodes.

Bappaditya Dey, Matthias Monden, Víctor Blanco, Sandip Halder, Stefan De Gendt

CoRR, 2024

2023

Improving Accuracy and Transferability of Machine Learning Chemical Activation Energies by Adding Electronic Structure Information.

Esteban Marques, Stefan De Gendt, Geoffrey Pourtois, Michiel J. van Setten

J. Chem. Inf. Model., March, 2023

Benchmarking Feature Extractors for Reinforcement Learning-Based Semiconductor Defect Localization.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

Automated Semiconductor Defect Inspection in Scanning Electron Microscope Images: a Systematic Review.

Thibault Lechien, Enrique Dehaerne, Bappaditya Dey, Víctor Blanco, Sandip Halder, Stefan De Gendt

CoRR, 2023

SEMI-CenterNet: A Machine Learning Facilitated Approach for Semiconductor Defect Inspection.

Vic De Ridder, Bappaditya Dey, Enrique Dehaerne, Sandip Halder, Stefan De Gendt, Bartel Van Waeyenberge

CoRR, 2023

YOLOv8 for Defect Inspection of Hexagonal Directed Self-Assembly Patterns: A Data-Centric Approach.

Enrique Dehaerne, Bappaditya Dey, Hossein Esfandiar, Lander Verstraete, Hyo Seon Suh, Sandip Halder, Stefan De Gendt

CoRR, 2023

A Deep Learning Framework for Verilog Autocompletion Towards Design and Verification Automation.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

Optimizing YOLOv7 for Semiconductor Defect Detection.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt

CoRR, 2023

2022

Code Generation Using Machine Learning: A Systematic Review.

Enrique Dehaerne, Bappaditya Dey, Sandip Halder, Stefan De Gendt, Wannes Meert

IEEE Access, 2022

2019

Devices and Circuits Using Novel 2-D Materials: A Perspective for Future VLSI Systems.

Giovanni V. Resta, Alessandra Leonhardt, Yashwanth Balaji, Stefan De Gendt, Pierre-Emmanuel Gaillardon, Giovanni De Micheli

IEEE Trans. Very Large Scale Integr. Syst., 2019

2014

Energy distribution of positive charges in high-k dielectric.

Sharifah Wan Muhamad Hatta, Zhigang Ji, Jianfu Zhang, Weidong Zhang, Norhayati Soin, Ben Kaczer, Stefan De Gendt, Guido Groeseneken

Microelectron. Reliab., 2014

2013

Nanoscale and device level electrical behavior of annealed ALD Hf-based gate oxide stacks grown with different precursors.

Albin Bayerl, Mario Lanza, Lidia Aguilera, Marc Porti, Montserrat Nafría, Xavier Aymerich, Stefan De Gendt

Microelectron. Reliab., 2013

2007

Mechanism of O₂-anneal induced V_fb shifts of Ru gated stacks.

Z. Li, Tom Schram, Luigi Pantisano, A. Stesmans, Thierry Conard, S. Shamuilia, V. V. Afanasiev, A. Akheyar, Sven Van Elshocht, D. P. Brunco, W. Deweerd, Y. Naoki, P. Lehnen, Stefan De Gendt, Kristin De Meyer

Microelectron. Reliab., 2007

Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling.

M. Houssa, Marc Aoulaiche, Stefan De Gendt, Guido Groeseneken, Marc M. Heyns

Microelectron. Reliab., 2007

2005

Modelling mobility degradation due to remote Coulomb scattering from dielectric charges and its impact on MOS device performance.

G. S. Lujan, Wim Magnus, L.-Å. Ragnarsson, Stefan Kubicek, Stefan De Gendt, Marc M. Heyns, Kristin De Meyer

Microelectron. Reliab., 2005

Observation and characterization of defects in HfO₂ high-K gate dielectric layers.

Vidya Kaushik, Martine Claes, Annelies Delabie, Sven Van Elshocht, Olivier Richard, Thierry Conard, Erika Rohr, Thomas Witters, Matty Caymax, Stefan De Gendt

Microelectron. Reliab., 2005

2001

In situ crystallisation in ZrO₂ thin films during high temperature X-ray diffraction.

Chao Zhao, Gert Roebben, Hugo Bender, Edward Young, S. Haukka, Michel Houssa, Mohamed Naili, Stefan De Gendt, Marc M. Heyns, Omer Van der Biest

Microelectron. Reliab., 2001

1999

Cost-effective cleaning and high-quality thin gate oxides.

Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke

IBM J. Res. Dev., 1999