Sriramkumar Venugopalan

According to our database, Sriramkumar Venugopalan authored at least 11 papers between 2011 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

A Dynamically Biased Multiband 2G/3G/4G Cellular Transmitter in 28 nm CMOS.

Siddharth Seth, Dae Hyun Kwon, Sriramkumar Venugopalan, Sang Won Son, Yongrong Zuo, Venumadhav Bhagavatula, Jaehyun Lim, Dongjin Oh, Thomas Byunghak Cho

IEEE J. Solid State Circuits, 2016

2013

Accurate Prediction of Random Telegraph Noise Effects in SRAMs and DRAMs.

Aadithya V. Karthik, Alper Demir, Sriramkumar Venugopalan, Jaijeet S. Roychowdhury

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

BSIM - SPICE Models Enable FinFET and UTB IC Designs.

Navid Paydavosi, Sriramkumar Venugopalan, Yogesh Singh Chauhan, Juan Pablo Duarte, Srivatsava Jandhyala, Ali M. Niknejad, Chenming Hu

IEEE Access, 2013

BSIM compact MOSFET models for SPICE simulation.

Yogesh Singh Chauhan, Sriramkumar Venugopalan, Navid Paydavosi, Pragya Kushwaha, Srivatsava Jandhyala, Juan Pablo Duarte, Shantanu Agnihotri, Chandan Yadav, Harshit Agarwal, Ali M. Niknejad, Chenming Calvin Hu

Proceedings of the 20th International Conference Mixed Design of Integrated Circuits and Systems, 2013

Flicker noise in advanced CMOS technology: Effects of halo implant.

Navid Paydavosi, Sriramkumar Venugopalan, Angada B. Sachid, Ali M. Niknejad, Chenming Hu, Sagnik Dey, Samuel Martin, Xin Zhang

Proceedings of the European Solid-State Device Research Conference, 2013

SRAM read current variability and its dependence on transistor statistics.

Sriramkumar Venugopalan, Vivek Joshi, Luis Zamudio, Matthias Goldbach, Gert Burbach, Ralf Van Bentum, Sriram Balasubramanian

Proceedings of the IEEE 2013 Custom Integrated Circuits Conference, 2013

2012

BSIM - Industry standard compact MOSFET models.

Yogesh Singh Chauhan, Sriramkumar Venugopalan, Mohammed A. Karim, Sourabh Khandelwal, Navid Paydavosi, Pankaj Thakur, Ali M. Niknejad, Chenming Hu

Proceedings of the 38th European Solid-State Circuit conference, 2012

Evaluation of the BSIM6 compact MOSFET model's scalability in 40nm CMOS technology.

Maria-Anna Chalkiadaki, Anurag Mangla, Christian C. Enz, Yogesh Singh Chauhan, Mohammed Ahosan Ul Karim, Sriramkumar Venugopalan, Ali M. Niknejad, Chenming Hu

Proceedings of the 38th European Solid-State Circuit conference, 2012

A non-iterative physical procedure for RF CMOS compact model extraction using BSIM6.

Sriramkumar Venugopalan, Krishnanshu Dandu, Samuel Martin, Richard Taylor, Claude Cirba, Xin Zhang, Ali M. Niknejad, Chenming Hu

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

SAMURAI: An accurate method for modelling and simulating non-stationary Random Telegraph Noise in SRAMs.

Aadithya V. Karthik, Alper Demir, Sriramkumar Venugopalan, Jaijeet S. Roychowdhury

Proceedings of the Design, Automation and Test in Europe, 2011

MUSTARD: a coupled, stochastic/deterministic, discrete/continuous technique for predicting the impact of random telegraph noise on SRAMs and DRAMs.

Aadithya V. Karthik, Sriramkumar Venugopalan, Alper Demir, Jaijeet S. Roychowdhury

Proceedings of the 48th Design Automation Conference, 2011