Sriram Madhavan

Orcid: 0009-0005-5544-9141

According to our database1, Sriram Madhavan authored at least 2 papers between 2013 and 2014.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2014
Quantified contribution of design for manufacturing to yield at 28nm.
Proceedings of the 19th IEEE European Test Symposium, 2014

2013
Deriving Feature Fail Rate from Silicon Volume Diagnostics Data.
IEEE Des. Test, 2013


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