Srikanth Krishnan

According to our database, Srikanth Krishnan authored at least 16 papers between 2005 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Study of Thermomechanical Damage Mechanism in Al Interconnects in Al-SiO2 structure by High Density Peak Current.

Hariram Mohanram, Harikrishnan Kumarasamy, Choong-Un Kim, Young-Joon Park, Srikanth Krishnan

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2022

A Critical Examination of the TCAD Modeling of Hot Carrier Degradation for LDMOS Transistors.

Bikram Kishore Mahajan, Yen-Pu Chen, Muhammad Ashraful Alam, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Quantifying Region-Specific Hot Carrier Degradation in LDMOS Transistors Using a Novel Charge Pumping Technique.

Bikram Kishore Mahajan, Yen-Pu Chen, Dhanoop Varghese, Vijay Reddy, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Reliability of Metal-Dielectric Structures Under Intermittent Current Pulsing.

Chung-Shuo Lee, Pavan Kumar Vaitheeswaran, Ganesh Subbarayan, Young-Joon Park, Jayhoon Chung, Srikanth Krishnan

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

A Novel 'I-V Spectroscopy' Technique to Deconvolve Threshold Voltage and Mobility Degradation in LDMOS Transistors.

Yen-Pu Chen, Bikram Kishore Mahajan, Dhanoop Varghese, Srikanth Krishnan, Vijay Reddy, Muhammad Ashraful Alam

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Current Crowding Impact on Electromigration in Al Interconnects.

Young-Joon Park, Jungwoo Joh, Jayhoon Chung, Srikanth Krishnan

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process.

Nakul Pande, Gyusung Park, Chris H. Kim, Srikanth Krishnan, Vijay Reddy

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Time-Dependent Dielectric Breakdown Under AC Stress in GaN MIS-HEMTs.

Ethan S. Lee, Luis Hurtado, Jungwoo Joh, Srikanth Krishnan, Sameer Pendharkar, Jesús A. del Alamo

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Cross-Modal Health State Estimation.

Nitish Nag, Vaibhav Pandey, Preston J. Putzel, Hari Bhimaraju, Srikanth Krishnan, Ramesh C. Jain

Proceedings of the 2018 ACM Multimedia Conference on Multimedia Conference, 2018

High voltage time-dependent dielectric breakdown in stacked intermetal dielectrics.

SangHoon Shin, Yen-Pu Chen, Woojin Ahn, Honglin Guo, Byron Williams, Jeff West, Tom Bonifield, Dhanoop Varghese, Srikanth Krishnan, Muhammad Ashraful Alam

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2013

ACE: A robust variability and aging sensor for high-k/metal gate SoC.

Min Chen, Vijay Reddy, Srikanth Krishnan, Jay Ondrusek, Yu Cao

Proceedings of the European Solid-State Device Research Conference, 2013

2012

Asymmetric Aging and Workload Sensitive Bias Temperature Instability Sensors.

Min Chen, Vijay Reddy, Srikanth Krishnan, Venkatesh Srinivasan, Yu Cao

IEEE Des. Test Comput., 2012

2009

Circuit aging prediction for low-power operation.

Rui Zheng, Jyothi Velamala, Vijay Reddy, Varsha Balakrishnan, Evelyn Mintarno, Subhasish Mitra, Srikanth Krishnan, Yu Cao

Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

2008

Statistical prediction of circuit aging under process variations.

Wenping Wang, Vijay Reddy, Bo Yang, Varsha Balakrishnan, Srikanth Krishnan, Yu Cao

Proceedings of the IEEE 2008 Custom Integrated Circuits Conference, 2008

2007

An Integrated Modeling Paradigm of Circuit Reliability for 65nm CMOS Technology.

Wenping Wang, Vijay Reddy, Anand T. Krishnan, Rakesh Vattikonda, Srikanth Krishnan, Yu Cao

Proceedings of the IEEE 2007 Custom Integrated Circuits Conference, 2007

2005

Impact of negative bias temperature instability on digital circuit reliability.

Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan

Microelectron. Reliab., 2005