Sridhar Narayanan

According to our database, Sridhar Narayanan authored at least 17 papers between 1992 and 2017.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2017

Keynote address tribute to Professor Mel Breuer: Contributions to CAD and Test.

Sandeep Gupta, Miron Abramovici, Magdy Abadir, Sridhar Narayanan

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

2015

Position Effects in Search Advertising and their Moderators: A Regression Discontinuity Approach.

Sridhar Narayanan, Kirthi Kalyanam

Mark. Sci., 2015

2011

Identifying Causal Marketing Mix Effects Using a Regression Discontinuity Design.

Wesley R. Hartmann, Harikesh S. Nair, Sridhar Narayanan

Mark. Sci., 2011

2009

Heterogeneous Learning and the Targeting of Marketing Communication for New Products.

Sridhar Narayanan, Puneet Manchanda

Mark. Sci., 2009

2005

IODINE: a tool to automatically infer dynamic invariants for hardware designs.

Sudheendra Hangal, Naveen Chandra, Sridhar Narayanan, Sandeep Chakravorty

Proceedings of the 42nd Design Automation Conference, 2005

2004

TSOtool: A Program for Verifying Memory Systems Using the Memory Consistency Model.

Sudheendra Hangal, Durgam Vahia, Chaiyasit Manovit, Juin-Yeu Joseph Lu, Sridhar Narayanan

Proceedings of the 31st International Symposium on Computer Architecture (ISCA 2004), 2004

2002

Implementation of a third-generation 1.1-GHz 64-bit microprocessor.

Georgios K. Konstadinidis, Kevin Normoyle, Samson Wong, Sutikshan Bhutani, Harry Stuimer, Timothy Johnson, Alan P. Smith, Daniel Y. Cheung, Fabrizio Romano, Shifeng Yu, Sung-Hun Oh, Victor Melamed, Sridhar Narayanan, David Bunsey, Cong Khieu, Kevin J. Wu, Ralf Schmitt, Andy Dumlao, Massimo Sutera, Jade Chau, K. James Lin, William S. Coates

IEEE J. Solid State Circuits, 2002

1997

An Efficient Scheme to Diagnose Scan Chains.

Sridhar Narayanan, Ashutosh Das

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

A fault diagnosis methodology for the UltraSPARC^TM-I microprocessor.

Sridhar Narayanan, R. Srinivasan, R. P. Kunda, Marc E. Levitt, Saied Bozorgui-Nesbat

Proceedings of the European Design and Test Conference, 1997

1995

Reconfiguration techniques for a single scan chain.

Sridhar Narayanan, Melvin A. Breuer

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

Asynchronous multiple scan chain.

Sridhar Narayanan, Melvin A. Breuer

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

Testability, Debuggability, and Manufacturability Features of the UltraSPARC^TM-I Microprocessor.

Marc E. Levitt, Srinivas Nori, Sridhar Narayanan, G. P. Grewal, Lynn Youngs, Anjali Jones, Greg Billus, Siva Paramanandam

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1993

Optimal Configuring of Multiple Scan Chains.

Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer

IEEE Trans. Computers, 1993

Reconfigurable scan chains: a novel approach to reduce test application time.

Sridhar Narayanan, Melvin A. Breuer

Proceedings of the 1993 IEEE/ACM International Conference on Computer-Aided Design, 1993

1992

Optimal Sequencing of Scan Registers.

Sridhar Narayanan, Charles Njinda, Melvin A. Breuer

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

Configuring multiple scan chains for minimum test time.

Sridhar Narayanan, Rajesh Gupta, Melvin A. Breuer

Proceedings of the 1992 IEEE/ACM International Conference on Computer-Aided Design, 1992

SIESTA: a multi-facet scan design system.

Sridhar Narayanan, Charles Njinda, Rajesh Gupta, Melvin A. Breuer

Proceedings of the conference on European design automation, 1992