Soyed Tuhin Ahmed
Orcid: 0000-0001-5179-2392
According to our database1,
Soyed Tuhin Ahmed
authored at least 26 papers
between 2021 and 2024.
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Bibliography
2024
One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2024
Design-time Reference Current Generation for Robust Spintronic-based Neuromorphic Architecture.
ACM J. Emerg. Technol. Comput. Syst., January, 2024
Few-Shot Testing: Estimating Uncertainty of Memristive Deep Neural Networks Using One Bayesian Test Vector.
CoRR, 2024
Tiny Deep Ensemble: Uncertainty Estimation in Edge AI Accelerators via Ensembling Normalization Layers with Shared Weights.
CoRR, 2024
Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning.
CoRR, 2024
CoRR, 2024
NN-ECC: Embedding Error Correction Codes in Neural Network Weight Memories using Multi-task Learning.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024
Proceedings of the IEEE European Test Symposium, 2024
NeuSpin: Design of a Reliable Edge Neuromorphic System Based on Spintronics for Green AI.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024
2023
SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures.
ACM Trans. Embed. Comput. Syst., October, 2023
Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration.
IEEE Des. Test, August, 2023
NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2023
SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation.
IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023
Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale.
CoRR, 2023
Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation.
CoRR, 2023
A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023
Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation.
Proceedings of the IEEE European Test Symposium, 2023
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
2022
Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022
Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices.
Proceedings of the 17th ACM International Symposium on Nanoscale Architectures, 2022
Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking.
Proceedings of the IEEE International Test Conference, 2022
Proceedings of the IEEE European Test Symposium, 2022
Proceedings of the 25th Euromicro Conference on Digital System Design, 2022
2021
NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.
Proceedings of the 26th IEEE European Test Symposium, 2021