Soyed Tuhin Ahmed

Orcid: 0000-0001-5179-2392

According to our database1, Soyed Tuhin Ahmed authored at least 26 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Bibliography

2024
One-Shot Online Testing of Deep Neural Networks Based on Distribution Shift Detection.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., October, 2024

Design-time Reference Current Generation for Robust Spintronic-based Neuromorphic Architecture.
ACM J. Emerg. Technol. Comput. Syst., January, 2024

Few-Shot Testing: Estimating Uncertainty of Memristive Deep Neural Networks Using One Bayesian Test Vector.
CoRR, 2024

Tiny Deep Ensemble: Uncertainty Estimation in Edge AI Accelerators via Ensembling Normalization Layers with Shared Weights.
CoRR, 2024

Scalable and Efficient Methods for Uncertainty Estimation and Reduction in Deep Learning.
CoRR, 2024

Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks.
CoRR, 2024

Concurrent Self-testing of Neural Networks Using Uncertainty Fingerprint.
CoRR, 2024

NN-ECC: Embedding Error Correction Codes in Neural Network Weight Memories using Multi-task Learning.
Proceedings of the 42nd IEEE VLSI Test Symposium, 2024

Testing Spintronics Implemented Monte Carlo Dropout-Based Bayesian Neural Networks.
Proceedings of the IEEE European Test Symposium, 2024

NeuSpin: Design of a Reliable Edge Neuromorphic System Based on Spintronics for Green AI.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

Enhancing Reliability of Neural Networks at the Edge: Inverted Normalization with Stochastic Affine Transformations.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023
SpinBayes: Algorithm-Hardware Co-Design for Uncertainty Estimation Using Bayesian In-Memory Approximation on Spintronic-Based Architectures.
ACM Trans. Embed. Comput. Syst., October, 2023

Fault-Tolerant Neuromorphic Computing With Memristors Using Functional ATPG for Efficient Recalibration.
IEEE Des. Test, August, 2023

NeuroScrub+: Mitigating Retention Faults Using Flexible Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., May, 2023

SpinDrop: Dropout-Based Bayesian Binary Neural Networks With Spintronic Implementation.
IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023

Scale-Dropout: Estimating Uncertainty in Deep Neural Networks Using Stochastic Scale.
CoRR, 2023

Spatial-SpinDrop: Spatial Dropout-based Binary Bayesian Neural Network with Spintronics Implementation.
CoRR, 2023

A Low Overhead Checksum Technique for Error Correction in Memristive Crossbar for Deep Learning Applications.
Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Online Fault-Tolerance for Memristive Neuromorphic Fabric Based on Local Approximation.
Proceedings of the IEEE European Test Symposium, 2023

Scalable Spintronics-based Bayesian Neural Network for Uncertainty Estimation.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023

2022
Fault-tolerant Neuromorphic Computing with Functional ATPG for Post-manufacturing Re-calibration.
Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Binary Bayesian Neural Networks for Efficient Uncertainty Estimation Leveraging Inherent Stochasticity of Spintronic Devices.
Proceedings of the 17th ACM International Symposium on Nanoscale Architectures, 2022

Compact Functional Test Generation for Memristive Deep Learning Implementations using Approximate Gradient Ranking.
Proceedings of the IEEE International Test Conference, 2022

Process and Runtime Variation Robustness for Spintronic-Based Neuromorphic Fabric.
Proceedings of the IEEE European Test Symposium, 2022

MVSTT: A Multi-Value Computation-in-Memory based on Spin-Transfer Torque Memories.
Proceedings of the 25th Euromicro Conference on Digital System Design, 2022

2021
NeuroScrub: Mitigating Retention Failures Using Approximate Scrubbing in Neuromorphic Fabric Based on Resistive Memories.
Proceedings of the 26th IEEE European Test Symposium, 2021


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