Soumitra Bose

According to our database1, Soumitra Bose authored at least 24 papers between 1988 and 2007.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2007
Delay Test Quality Evaluation Using Bounded Gate Delays.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Delay fault simulation with bounded gate delay mode.
Proceedings of the 2007 IEEE International Test Conference, 2007

Estimating stuck fault coverage in sequential logic using state traversal and entropy analysis.
Proceedings of the 2007 IEEE International Test Conference, 2007

2006
Upper Bounding Fault Coverage by Structural Analysis and Signal Monitoring.
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Fault Coverage Estimation for Non-Random Functional Input Sequences.
Proceedings of the 2006 IEEE International Test Conference, 2006

2005
Schematic array models for associative and non-associative memory circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005

2004
Modeling Custom Digital Circuits for Test.
J. Electron. Test., 2004

Extraction of Schematic Array Models for Memory Circuits.
Proceedings of the 2004 Design, 2004

2002
Automated Modeling of Custom Digital Circuits for Test.
Proceedings of the 2002 Design, 2002

1998
A rated-clock test method for path delay faults.
IEEE Trans. Very Large Scale Integr. Syst., 1998

Concurrent fault simulation on message passing multicomputers.
IEEE Trans. Very Large Scale Integr. Syst., 1998

Deriving Logic Systems for Path Delay Test Generation.
IEEE Trans. Computers, 1998

1997
Algorithms for Switch Level Delay Fault Simulation.
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1995
Sequential logic path delay test generation by symbolic analysis.
Proceedings of the 4th Asian Test Symposium (ATS '95), 1995

1993
Path delay fault simulation of sequential circuits.
IEEE Trans. Very Large Scale Integr. Syst., 1993

The optimistic update theorem for path delay testing in sequential circuits.
J. Electron. Test., 1993

A Path Delay Fault Simulator for Sequential Circuits.
Proceedings of the Sixth International Conference on VLSI Design, 1993

Generation of Compact Delay Tests by Multiple-Path Activation.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

Delay fault testability evaluation through timing simulation.
Proceedings of the Third Great Lakes Symposium on Design Automation of High Performance VLSI Systems, 1993

Logic systems for path delay test generation.
Proceedings of the European Design Automation Conference 1993, 1993

1992
PARTHENON: A Parallel Theorem Prover for Non-Horn Clauses.
J. Autom. Reason., 1992

Concurrent Fault Simulation of Logic Gates and Memory Blocks on Message Passing Multicomputers.
Proceedings of the 29th Design Automation Conference, 1992

1989
Verifying pipelined hardware using symbolic logic simulation.
Proceedings of the Computer Design: VLSI in Computers and Processors, 1989

1988
PARTHENON: A Parallel Theorem Prover for Non-Horn Clauses.
Proceedings of the 9th International Conference on Automated Deduction, 1988


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