Soumendu Bhattacharya

According to our database, Soumendu Bhattacharya authored at least 36 papers between 1993 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2013

Predicting die-level process variations from wafer test data for analog devices: A feasibility study.

Shyam Kumar Devarakond, Jennifer McCoy, Amit Nahar, John M. Carulli Jr., Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 14th Latin American Test Workshop, 2013

2012

Low Cost EVM Testing of Wireless RF SoC Front-Ends Using Multitones.

Vishwanath Natarajan, Hyun Woo Choi, Aritra Banerjee, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Friedrich Taenzler, Soumendu Bhattacharya

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Concurrent Device/Specification Cause-Effect Monitoring for Yield Diagnosis Using Alternate Diagnostic Signatures.

Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee

IEEE Des. Test Comput., 2012

2011

Optimized Multitone Test Stimulus Driven Diagnosis of RF Transceivers Using Model Parameter Estimation.

Aritra Banerjee, Vishwanath Natarajan, Shreyas Sen, Abhijit Chatterjee, Ganesh Srinivasan, Soumendu Bhattacharya

Proceedings of the VLSI Design 2011: 24th International Conference on VLSI Design, 2011

2010

Concurrent process model and specification cause-effect monitoring using alternate diagnostic signatures.

Shyam Kumar Devarakond, Shreyas Sen, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

2009

Efficient EVM Testing of Wireless OFDM Transceivers Using Null Carriers.

Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee

IEEE Trans. Very Large Scale Integr. Syst., 2009

Iterative built-in testing and tuning of mixed-signal/RF systems.

Abhijit Chatterjee, Donghoon Han, Vishwanath Natarajan, Shyam Kumar Devarakond, Shreyas Sen, Hyun Woo Choi, Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhilash Goyal, Deuk Lee, Madhavan Swaminathan

Proceedings of the 27th International Conference on Computer Design, 2009

2008

System-Level Specification Testing Of Wireless Transceivers.

Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee

IEEE Trans. Very Large Scale Integr. Syst., 2008

Fast Accurate Tests for Multi-Carrier Transceiver Specifications: EVM and Noise.

Rajarajan Senguttuvan, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008

2007

Signature Testing of Analog and RF Circuits: Algorithms and Methodology.

Ramakrishna Voorakaranam, Selim Sermet Akbay, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee

IEEE Trans. Circuits Syst. I Regul. Pap., 2007

Low-cost parametric test and diagnosis of RF systems using multi-tone response envelope detection.

Donghoon Han, Soumendu Bhattacharya, Abhijit Chatterjee

IET Comput. Digit. Tech., 2007

Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors.

Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

2006

An Accurate DNA Sensing and Diagnosis Methodology Using Fabricated Silicon Nanopores.

Soumendu Bhattacharya, Sankar Nair, Abhijit Chatterjee

IEEE Trans. Circuits Syst. I Regul. Pap., 2006

A DFT Approach for Testing Embedded Systems Using DC Sensors.

Soumendu Bhattacharya, Abhijit Chatterjee

IEEE Des. Test Comput., 2006

Alternate Electrical Tests for Extracting Mechanical Parameters of MEMS Accelerometer Sensors.

Vishwanath Natarajan, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Design of Soft Error Resilient Linear Digital Filters Using Checksum-Based Probabilistic Error Correction.

Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006

Efficient DNA Sensing with Fabricated Silicon Nanopores: Diagnosis Methodology and Algorithms.

Soumendu Bhattacharya, Vishwanath Natarajan, Abhijit Chatterjee, Sankar Nair

Proceedings of the 19th International Conference on VLSI Design (VLSI Design 2006), 2006

Probabilistic Error Correction in Linear Digital Filters Using Checksum Codes.

Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 7th Latin American Test Workshop, 2006

Low Cost Parametric Failure Diagnosis of RF Transceivers.

Donghoon Han, Shalabh Goyal, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 11th European Test Symposium, 2006

Improving SNR for DSM Linear Systems Using Probabilistic Error Correction and State Restoration: A Comparative Study.

Maryam Ashouei, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 11th European Test Symposium, 2006

2005

Alternate Testing of Analog and RF Systems using Extracted Test Response Features.

Soumendu Bhattacharya

PhD thesis, 2005

Optimized wafer-probe and assembled package test design for analog circuits.

Soumendu Bhattacharya, Abhijit Chatterjee

ACM Trans. Design Autom. Electr. Syst., 2005

Alternate Testing of RF Transceivers Using Optimized Test Stimulus for Accurate Prediction of System Specifications.

Soumendu Bhattacharya, Achintya Halder, Ganesh Srinivasan, Abhijit Chatterjee

J. Electron. Test., 2005

Production Test Methods for Measuring 'Out-of-Band' Interference of Ultra Wide Band (UWB) Devices.

Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

A System-Level Alternate Test Approach for Specification Test of RF Transceivers in Loopback Mode.

Achintya Halder, Soumendu Bhattacharya, Ganesh Srinivasan, Abhijit Chatterjee

Proceedings of the 18th International Conference on VLSI Design (VLSI Design 2005), 2005

Production test enhancement techniques for MB-OFDM ultra-wide band (UWB) devices: EVM and CCDF.

Soumendu Bhattacharya, Rajarajan Senguttuvan, Abhijit Chatterjee

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

On-Chip Self-Calibration of RF Circuits Using Specification-Driven Built-In Self Test (S-BIST).

Donghoon Han, Selim Sermet Akbay, Soumendu Bhattacharya, Abhijit Chatterjee, William R. Eisenstadt

Proceedings of the 11th IEEE International On-Line Testing Symposium (IOLTS 2005), 2005

2004

System-level Testing of RF Transmitter Specifications Using Optimized Periodic Bitstreams.

Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Achintya Halder, Abhijit Chatterjee

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Use of Embedded Sensors for Built-In-Test of RF Circuits.

Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Test Time Reduction for ACPR Measurement of Wireless Transceivers Using Periodic Bit-Stream Sequences.

Soumendu Bhattacharya, Ganesh Srinivasan, Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 2nd IEEE International Workshop on Electronic Design, 2004

Efficient Test Strategy for TDMA Power Amplifiers Using Transient Current Measurements: Uses and Benefit.

Ganesh Srinivasan, Soumendu Bhattacharya, Sasikumar Cherubal, Abhijit Chatterjee

Proceedings of the 2004 Design, 2004

A Built-In Loopback Test Methodology for RF Transceiver Circuits Using Embedded Sensor Circuits.

Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004

2003

High Coverage Analog Wafer-Probe Test Design and Co-optimization with Assembled-Package Test to Minimize Overall Test Cost.

Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Automatic Multitone Alternate Test Generation For RF Circuits Using Behavioral Models.

Achintya Halder, Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Constrained Specification-Based Test Stimulus Generation for Analog Circuits Using Nonlinear Performance Prediction Models.

Soumendu Bhattacharya, Abhijit Chatterjee

Proceedings of the 1st IEEE International Workshop on Electronic Design, 2002

1993

Visualization in linear programming using parallel coordinates.

Abhijit Chatterjee, Partha Pratim Das, Soumendu Bhattacharya

Pattern Recognit., 1993