Souhir Mhira

According to our database, Souhir Mhira authored at least 15 papers between 2016 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Correlation Technologies for OTA Testing of mmWave Mobile Devices Using Energy Metrics.

Sidina Wane, T. V. Dinh, Q. H. Tran, Damienne Bajon, F. Ferrero, Lionel Duvillaret, Gwenaël Gaborit, Jacques Sombrin, E. de Lédinghen, P. Laban, Vincent Huard, Souhir Mhira, L. Tombakdjian, Philippe Ratajczak, A. Bousseksou

Proceedings of the 2022 IEEE Radio and Wireless Symposium, 2022

Runtime Test Solution for Adaptive Aging Compensation and Fail Operational Safety mode.

Vincent Huard, Francois Jacquet, Souhir Mhira, Lionel Jure, Olivier Montfort, Mathieu Louvat, L. Zaia, F. Bertrand, E. Acacia, O. Caffin, H. Belhadj, O. Durand, Nils Exibard, Vincent Bonnet, A. Charvier, Paolo Bernardi, Riccardo Cantoro

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2018

Investigation of speed sensors accuracy for process and aging compensation.

Riddhi Jitendrakumar Shah, Florian Cacho, Vincent Huard, Souhir Mhira, D. Arora, Pankaj Agarwal, Shubham Kumar, S. Balaraman, Bijoy Kumar Singh, Lorena Anghel

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Resilient automotive products through process, temperature and aging compensation schemes.

Souhir Mhira, Vincent Huard, D. Arora, Philippe Flatresse, Alain Bravaix

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Key parameters driving transistor degradation in advanced strained SiGe channels.

Vincent Huard, Cheikh Ndiaye, M. Arabi, Narendra Parihar, X. Federspiel, Souhir Mhira, S. Mahapatra, Alain Bravaix

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Managing electrical reliability in consumer systems for improved energy efficiency.

Vincent Huard, Souhir Mhira, A. Barclais, X. Lecocq, F. Raugi, M. Cantournet, Alain Bravaix

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Enabling robust automotive electronic components in advanced CMOS nodes.

Vincent Huard, Souhir Mhira, Florian Cacho, Alain Bravaix

Microelectron. Reliab., 2017

Cognitive approach to support dynamic aging compensation.

Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, David Meyer, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix

Proceedings of the IEEE International Test Conference, 2017

Dynamic aging compensation and Safety measures in Automotive environment.

Souhir Mhira, Vincent Huard, Ahmed Benhassain, Florian Cacho, Sylvie Naudet, Abhishek Jain, C. R. Parthasarathy, Alain Bravaix

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Investigation of critical path selection for in-situ monitors insertion.

Florian Cacho, Ahmed Benhassain, Riddhi Jitendrakumar Shah, Souhir Mhira, Vincent Huard, Lorena Anghel

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

Workload dependent reliability timing analysis flow.

Ajith Sivadasan, Armelle Notin, Vincent Huard, Etienne Maurin, Souhir Mhira, Florian Cacho, Lorena Anghel

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Potentiality of healing techniques in hot-carrier damaged 28 nm FDSOI CMOS nodes.

Alain Bravaix, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Vincent Huard

Microelectron. Reliab., 2016

In-situ slack monitors: taking up the challenge of on-die monitoring of variability and reliability.

Ahmed Benhassain, Souhir Mhira, Florian Cacho, Vincent Huard, Lorena Anghel

Proceedings of the 1st IEEE International Verification and Security Workshop, 2016

Activity profiling: Review of different solutions to develop reliable and performant design.

Florian Cacho, Ahmed Benhassain, Souhir Mhira, Ajith Sivadasan, Vincent Huard, P. Cathelin, Vincent Knopik, Abhishek Jain, C. R. Parthasarathy, Lorena Anghel

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016

Hot-carrier and BTI damage distinction for high performance digital application in 28nm FDSOI and 28nm LP CMOS nodes.

Alain Bravaix, M. Saliva, Florian Cacho, X. Federspiel, Cheikh Ndiaye, Souhir Mhira, Edith Kussener, E. Pauly, Vincent Huard

Proceedings of the 22nd IEEE International Symposium on On-Line Testing and Robust System Design, 2016