Sooryong Lee

According to our database, Sooryong Lee authored at least 6 papers between 1999 and 2002.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2002

Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.

Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

A New ATPG Algorithm to Limit Test Set Size and Achieve Multiple Detections of All Faults.

Sooryong Lee, Brad Cobb, Jennifer Dworak, Michael R. Grimaila, M. Ray Mercer

Proceedings of the 2002 Design, 2002

2001

Defect-Oriented Testing and Defective-Part-Level Prediction.

Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang

IEEE Des. Test Comput., 2001

2000

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D.

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

1999

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies.

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999