Soonyoung Lee

According to our database, Soonyoung Lee authored at least 17 papers between 2008 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

See It All: Contextualized Late Aggregation for 3D Dense Captioning.

Minjung Kim, Hyung Suk Lim, Seung Hwan Kim, Soonyoung Lee, Bumsoo Kim, Gunhee Kim

CoRR, 2024

EXAONEPath 1.0 Patch-level Foundation Model for Pathology.

Juseung Yun, Yi Hu, Jinhyung Kim, Jongseong Jang, Soonyoung Lee

CoRR, 2024

Exploring the Spectrum of Visio-Linguistic Compositionality and Recognition.

Youngtaek Oh, Pyunghwan Ahn, Jinhyung Kim, Gwangmo Song, Soonyoung Lee, In So Kweon, Junmo Kim

CoRR, 2024

Bi-directional Contextual Attention for 3D Dense Captioning.

Minjung Kim, Hyung Suk Lim, Soonyoung Lee, Bumsoo Kim, Gunhee Kim

Proceedings of the Computer Vision - ECCV 2024, 2024

See It All: Contextualized Late Aggregation for 3D Dense Captioning.

Minjung Kim, Hyung Lim, Seung Hwan Kim, Soonyoung Lee, Bumsoo Kim, Gunhee Kim

Proceedings of the Findings of the Association for Computational Linguistics, 2024

2023

Universal Noise Annotation: Unveiling the Impact of Noisy annotation on Object Detection.

Kwangrok Ryoo, Yeonsik Jo, Seungjun Lee, Mira Kim, Ahra Jo, Seung Hwan Kim, Seungryong Kim, Soonyoung Lee

CoRR, 2023

2022

CEDe: A collection of expert-curated datasets with atom-level entity annotations for Optical Chemical Structure Recognition.

Rodrigo Hormazabal, Changyoung Park, Soonyoung Lee, Sehui Han, Yeonsik Jo, Jaewan Lee, Ahra Jo, Seung Hwan Kim, Jaegul Choo, Moontae Lee, Honglak Lee

Proceedings of the Advances in Neural Information Processing Systems 35: Annual Conference on Neural Information Processing Systems 2022, 2022

L-Verse: Bidirectional Generation Between Image and Text.

Taehoon Kim, Gwangmo Song, Sihaeng Lee, Sangyun Kim, Yewon Seo, Soonyoung Lee, Seung Hwan Kim, Honglak Lee, Kyunghoon Bae

Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern Recognition, 2022

2021

FadeNet: Deep Learning-Based mm-Wave Large-Scale Channel Fading Prediction and its Applications.

Vishnu V. Ratnam, Hao Chen, Sameer Pawar, Bingwen Zhang, Charlie Jianzhong Zhang, Young-Jin Kim, Soonyoung Lee, Minsung Cho, Sung-Rok Yoon

IEEE Access, 2021

2019

SEIFF: Soft Error Immune Flip-Flop for Mitigating Single Event Upset and Single Event Transient in 10 nm FinFET.

Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Seungbae Lee, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Investigation of alpha-induced single event transient (SET) in 10 nm FinFET logic circuit.

Taiki Uemura, Soonyoung Lee, Dahye Min, Ihlhwa Moon, Jungman Lim, Seungbae Lee, Hyun-Chul Sagong, Sangwoo Pae

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

An alternative approach to measure alpha-particle-induced SEU cross-section for flip-chip packaged SRAM devices: High energy alpha backside irradiation.

Saqib A. Khan, Chul Seung Lim, GeunYong Bak, Sanghyeon Baeg, Soonyoung Lee

Microelectron. Reliab., 2017

2015

Radiation-induced soft error rate analyses for 14 nm FinFET SRAM devices.

Soonyoung Lee, Ilgon Kim, Sungmock Ha, Cheong-sik Yu, Jinhyun Noh, Sangwoo Pae, Jongwoo Park

Proceedings of the IEEE International Reliability Physics Symposium, 2015

Logic soft error study with 800-MHz DDR3 SDRAMs in 3x nm using proton and neutron beams.

GeunYong Bak, Soonyoung Lee, Hosung Lee, Kyungbae Park, Sanghyeon Baeg, Shi-Jie Wen, Richard Wong, Charlie Slayman

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

An Efficient Multiple Cell Upsets Tolerant Content-Addressable Memory.

Syed Mohsin Abbas, Soonyoung Lee, Sanghyeon Baeg, Sungju Park

IEEE Trans. Computers, 2014

2012

Soft Error Issues with Scaling Technologies.

Sanghyeon Baeg, Jongsun Bae, Soonyoung Lee, Chul Seung Lim, Sang Hoon Jeon, Hyeonwoo Nam

Proceedings of the 21st IEEE Asian Test Symposium, 2012

2008

New smith predictor control using disturbance observer for steam superheater and steam pressure of the boiler.

Soonyoung Lee, Yonghwan Shin, Eunsung Jang, Hwi-Beom Shin

Proceedings of the 10th International Conference on Control, 2008