Soonyoung Cha

According to our database, Soonyoung Cha authored at least 10 papers between 2014 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Negative Bias Temperature Instability and Gate Oxide Breakdown Modeling in Circuits With Die-to-Die Calibration Through Power Supply and Ground Signal Measurements.

Soonyoung Cha, Taizhi Liu, Linda Milor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Adaptive supply voltage and duty cycle controller for yield-power optimization of ICs.

Soonyoung Cha, Linda Milor

Proceedings of the 7th IEEE International Workshop on Advances in Sensors and Interfaces, 2017

2015

System-level variation-aware aging simulator using a unified novel gate-delay model for bias temperature instability, hot carrier injection, and gate oxide breakdown.

Taizhi Liu, Chang-Chih Chen, Soonyoung Cha, Linda Milor

Microelectron. Reliab., 2015

Built-in self-test for bias temperature instability, hot-carrier injection, and gate oxide breakdown in embedded DRAMs.

Dae Hyun Kim, Soonyoung Cha, Linda S. Milor

Microelectron. Reliab., 2015

AVERT: An elaborate model for simulating variable retention time in DRAMs.

Dae Hyun Kim, Soonyoung Cha, Linda S. Milor

Microelectron. Reliab., 2015

The die-to-die calibrated combined model of negative bias temperature instability and gate oxide breakdown from device to system.

Soonyoung Cha, Dae Hyun Kim, Taizhi Liu, Linda S. Milor

Microelectron. Reliab., 2015

Processor-level reliability simulator for time-dependent gate dielectric breakdown.

Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda S. Milor

Microprocess. Microsystems, 2015

MBIST and statistical hypothesis test for time dependent dielectric breakdowns due to GOBD vs. BTDDB in an SRAM array.

Woongrae Kim, Chang-Chih Chen, Soonyoung Cha, Linda Milor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Estimation of remaining life using embedded SRAM for wearout parameter extraction.

Woongrae Kim, Chang-Chih Chen, Taizhi Liu, Soonyoung Cha, Linda Milor

Proceedings of the 6th International Workshop on Advances in Sensors and Interfaces, 2015

2014

Extraction of threshold voltage degradation modeling due to Negative Bias Temperature Instability in circuits with I/O measurements.

Soonyoung Cha, Chang-Chih Chen, Taizhi Liu, Linda S. Milor

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014