Soo Young Lee

According to our database, Soo Young Lee authored at least 11 papers between 1992 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

A Physics-informed and data-driven deep learning approach for wave propagation and its scattering characteristics.

Soo Young Lee, Choon-Su Park, Keonhyeok Park, Hyung Jin Lee, Seungchul Lee

Eng. Comput., August, 2023

2022

Deep Learning-Enabled High-Resolution and Fast Sound Source Localization in Spherical Microphone Array System.

Soo Young Lee, Jiho Chang, Seungchul Lee

IEEE Trans. Instrum. Meas., 2022

2021

Deep Learning-Based Estimation of the Unknown Road Profile and State Variables for the Vehicle Suspension System.

Gyuwon Kim, Soo Young Lee, Jong-Seok Oh, Seungchul Lee

IEEE Access, 2021

2020

Vision-Based Fault Diagnostics Using Explainable Deep Learning With Class Activation Maps.

Kyung Ho Sun, Hyunsuk Huh, Bayu Adhi Tama, Soo Young Lee, Joon Ha Jung, Seungchul Lee

IEEE Access, 2020

Spatial and Sequential Deep Learning Approach for Predicting Temperature Distribution in a Steel-Making Continuous Casting Process.

Soo Young Lee, Bayu Adhi Tama, Changyun Choi, Jong-Yeon Hwang, Jonggeun Bang, Seungchul Lee

IEEE Access, 2020

2009

Performance Improvement of Fault Tolerant CORBA Based Intelligent Transportation Systems (ITS) with an Autonomous Agent.

Woonsuk Suh, Soo Young Lee, Eunseok Lee

Proceedings of the Next Generation Information Technologies and Systems, 2009

1995

Test application time reduction for sequential circuits with scan.

Soo Young Lee, Kewal K. Saluja

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995

1994

Sequential test generation with reduced test clocks for partial scan designs.

Soo Young Lee, Kewal K. Saluja

Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

1993

An Efficient Algorithm for Sequential Circuit Test Generation.

Todd P. Kelsey, Kewal K. Saluja, Soo Young Lee

IEEE Trans. Computers, 1993

Efficient Test Vectors for ISCAS Sequential Benchmark Circuits.

Soo Young Lee, Kewal K. Saluja

Proceedings of the 1993 IEEE International Symposium on Circuits and Systems, 1993

1992

An algorithm to reduce test application time in full scan designs.

Soo Young Lee, Kewal K. Saluja

Proceedings of the 1992 IEEE/ACM International Conference on Computer-Aided Design, 1992