Sonia Bendhia
Orcid: 0000-0002-5781-3737
According to our database1,
Sonia Bendhia
authored at least 22 papers
between 2001 and 2024.
Collaborative distances:
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Bibliography
2024
Accelerated characterisation of Operational Amplifiers' susceptibility using multitone disturbance.
Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024
2021
Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.
IEEE Trans. Instrum. Meas., 2021
2015
Electronic counterfeit detection based on the measurement of electromagnetic fingerprint.
Microelectron. Reliab., 2015
Analysis and modeling of passive device degradation for a long-term electromagnetic emission study of a DC-DC converter.
Microelectron. Reliab., 2015
Bandgap failure study due to parasitic bipolar substrate coupling in Smart Power mixed ICs.
Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015
2014
Effect of Aging on Power Integrity and Conducted Emission of Digital Integrated Circuits.
J. Low Power Electron., 2014
Design of on-chip sensors to monitor electromagnetic activity in ICs: Towards on-line diagnosis and self-healing.
Proceedings of the 15th Latin American Test Workshop, 2014
2013
LDO regulator DC characteristic and susceptibility prediction after electrical stress ageing.
Microelectron. Reliab., 2013
Long-term Electro-Magnetic Robustness of Integrated Circuits: EMRIC research project.
Microelectron. Reliab., 2013
Proceedings of the 14th Latin American Test Workshop, 2013
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
Characterization and modeling of electrical stresses on digital integrated circuits power integrity and conducted emission.
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013
2012
IEEE Trans. Instrum. Meas., 2012
J. Electron. Test., 2012
2011
Study of the impact of hot carrier injection to immunity of MOSFET to electromagnetic interferences.
Microelectron. Reliab., 2011
Experimental verification of the usefulness of the nth power law MOSFET model under hot carrier wearout.
Microelectron. Reliab., 2011
IEICE Trans. Electron., 2011
2010
Effective Teaching of the Physical Design of Integrated Circuits Using Educational Tools.
IEEE Trans. Educ., 2010
Microelectron. Reliab., 2010
2004
Microelectron. J., 2004
2001
Proc. IEEE, 2001