Somayeh Sadeghi Kohan

According to our database, Somayeh Sadeghi Kohan authored at least 19 papers between 2010 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Workload-Aware Periodic Interconnect BIST.

Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich

IEEE Des. Test, August, 2024

2023

Approximate Communication: Balancing Performance, Power, Reliability, and Safety.

Abdalrhman Badran, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand

Proceedings of the IEEE European Test Symposium, 2023

Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.

Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2023

Optimizing the Streaming of Sensor Data with Approximate Communication.

Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand, Hans-Joachim Wunderlich

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2021

Stress-Aware Periodic Test of Interconnects.

Somayeh Sadeghi Kohan, Sybille Hellebrand, Hans-Joachim Wunderlich

J. Electron. Test., 2021

2020

Self-Adjusting Monitor for Measuring Aging Rate and Advancement.

Somayeh Sadeghi Kohan, Mehdi Kamal, Zainalabedin Navabi

IEEE Trans. Emerg. Top. Comput., 2020

Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.

Somayeh Sadeghi Kohan, Sybille Hellebrand

Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study.

Alexander Sprenger, Somayeh Sadeghi Kohan, Jan Dennis Reimer, Sybille Hellebrand

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2018

Near-Optimal Node Selection Procedure for Aging Monitor Placement.

Somayeh Sadeghi Kohan, Arash Vafaei, Zainalabedin Navabi

Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.

Ramin Rezaeizadeh Rookerd, Somayeh Sadeghi Kohan, Zainalabedin Navabi

Proceedings of the 2018 on Great Lakes Symposium on VLSI, 2018

2016

Universal mitigation of NBTI-induced aging by design randomization.

Maksim Jenihhin, Alexander Kamkin, Zainalabedin Navabi, Somayeh Sadeghi Kohan

Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015

A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.

Bijan Alizadeh, Payman Behnam, Somayeh Sadeghi Kohan

IEEE Trans. Computers, 2015

Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation.

Somayeh Sadeghi Kohan, Arezoo Kamran, Farnaz Forooghifar, Zainalabedin Navabi

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

Online self adjusting progressive age monitoring of timing variations.

Somayeh Sadeghi Kohan, Mehdi Kamal, John McNeil, Paolo Prinetto, Zain Navabi

Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2014

An off-line MDSI interconnect BIST incorporated in BS 1149.1.

Marzieh Mohammadi, Somayeh Sadeghi Kohan, Nasser Masoumi, Zainalabedin Navabi

Proceedings of the 19th IEEE European Test Symposium, 2014

Improving polynomial datapath debugging with HEDs.

Somayeh Sadeghi Kohan, Payman Behnam, Bijan Alizadeh, Masahiro Fujita, Zainalabedin Navabi

Proceedings of the 19th IEEE European Test Symposium, 2014

2013

A new structure for interconnect offline testing.

Somayeh Sadeghi Kohan, Shahrzad Keshavarz, Farzaneh Zokaee, Farimah Farahmandi, Zainalabedin Navabi

Proceedings of the East-West Design & Test Symposium, 2013

2012

BS 1149.1 extensions for an online interconnect fault detection and recovery.

Somayeh Sadeghi Kohan, Majid Namaki-Shoushtari, Fatemeh Javaheri, Zainalabedin Navabi

Proceedings of the 2012 IEEE International Test Conference, 2012

2010

Virtual tester development using HDL/PLI.

Arezoo Kamran, Nastaran Nemati, Somayeh Sadeghi Kohan, Zainalabedin Navabi

Proceedings of the 2010 East-West Design & Test Symposium, 2010