Somayeh Sadeghi Kohan

Orcid: 0000-0001-7246-0610

According to our database1, Somayeh Sadeghi Kohan authored at least 19 papers between 2010 and 2024.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

Legend:

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In proceedings 
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PhD thesis 
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Links

On csauthors.net:

Bibliography

2024
Workload-Aware Periodic Interconnect BIST.
IEEE Des. Test, August, 2024

2023
Approximate Communication: Balancing Performance, Power, Reliability, and Safety.
Proceedings of the IEEE European Test Symposium, 2023

Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.
Proceedings of the 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, 2023

Optimizing the Streaming of Sensor Data with Approximate Communication.
Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2021
Stress-Aware Periodic Test of Interconnects.
J. Electron. Test., 2021

2020
Self-Adjusting Monitor for Measuring Aging Rate and Advancement.
IEEE Trans. Emerg. Top. Comput., 2020

Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects.
Proceedings of the 38th IEEE VLSI Test Symposium, 2020

Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2018
Near-Optimal Node Selection Procedure for Aging Monitor Placement.
Proceedings of the 24th IEEE International Symposium on On-Line Testing And Robust System Design, 2018

Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.
Proceedings of the 2018 on Great Lakes Symposium on VLSI, 2018

2016
Universal mitigation of NBTI-induced aging by design randomization.
Proceedings of the 2016 IEEE East-West Design & Test Symposium, 2016

2015
A Scalable Formal Debugging Approach with Auto-Correction Capability Based on Static Slicing and Dynamic Ranking for RTL Datapath Designs.
IEEE Trans. Computers, 2015

Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation.
Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

Online self adjusting progressive age monitoring of timing variations.
Proceedings of the 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2015

2014
An off-line MDSI interconnect BIST incorporated in BS 1149.1.
Proceedings of the 19th IEEE European Test Symposium, 2014

Improving polynomial datapath debugging with HEDs.
Proceedings of the 19th IEEE European Test Symposium, 2014

2013
A new structure for interconnect offline testing.
Proceedings of the East-West Design & Test Symposium, 2013

2012
BS 1149.1 extensions for an online interconnect fault detection and recovery.
Proceedings of the 2012 IEEE International Test Conference, 2012

2010
Virtual tester development using HDL/PLI.
Proceedings of the 2010 East-West Design & Test Symposium, 2010


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