Solomon Max

According to our database, Solomon Max authored at least 11 papers between 1989 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Enhanced ADC sine wave histogram test.

Solomon Max, Richard Liggiero

Proceedings of the 2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings, 2015

2006

Measuring the timing jitter of ATE in the frequency domain.

Luca Schiano, Mariam Momenzadeh, Fengming Zhang, Young-Jun Lee, Thomas Kane, Solomon Max, Philip Perkins, Yong-Bin Kim, Fabrizio Lombardi, Fred J. Meyer

IEEE Trans. Instrum. Meas., 2006

2003

Analysis and measurement of timing jitter induced by radiated EMI noise in automatic test equipment.

Young-Jun Lee, Thomas Kane, Jong-Jin Lim, Young Jun Schiano, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max

IEEE Trans. Instrum. Meas., 2003

A Digital and Wide Power Bandwidth H-Field Generator for Automatic Test Equipment.

Fengming Zhang, Young-Jun Lee, Thomas Kane, Luca Schiano, Mariam Momenzadeh, Yong-Bin Kim, Fred J. Meyer, Fabrizio Lombardi, Solomon Max, Phil Perkinson

Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003

2001

Ramp testing of ADC transition levels using finite resolution ramps.

Solomon Max

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

1999

Testing high speed high accuracy analog to digital converters embedded in systems on a chip.

Solomon Max

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

When "almost" is good enough: a fresh look at DSP clock rates.

Eric Rosenfeld, Solomon Max

Proceedings of the Proceedings IEEE International Test Conference 1998, 1998

1996

Extending Calibration Intervals.

Solomon Max

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

1995

Visualizing Quality.

Solomon Max

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

1994

Ensuring System Traceability to International Standards.

Solomon Max

Proceedings of the Proceedings IEEE International Test Conference 1994, 1994

1989

Fast Accurate and Complete ADC Testing.

Solomon Max

Proceedings of the Proceedings International Test Conference 1989, 1989