Soham Roy

According to our database, Soham Roy authored at least 17 papers between 2019 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A Survey and Recent Advances: Machine Intelligence in Electronic Testing.

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal

J. Electron. Test., April, 2024

An Amalgamated Testability Measure Derived from Machine Intelligence.

Soham Roy, Vishwani D. Agrawal

Proceedings of the 37th International Conference on VLSI Design and 23rd International Conference on Embedded Systems, 2024

Quantum Implementation of Linear and Non-Linear Layers.

Anubhab Baksi, Sumanta Chakraborty, Anupam Chattopadhyay, Matthew Chun, SK Hafizul Islam, Kyungbae Jang, Hyunji Kim, Yujin Oh, Soham Roy, Hwajeong Seo, Siyi Wang

Proceedings of the 37th IEEE International System-on-Chip Conference, 2024

Unsupervised Learning Provides Intelligence for Testing Hard to Detect Faults.

Soham Roy, Vishwani D. Agrawal

Proceedings of the IEEE International Test Conference, 2024

Effectiveness of Timing-Aware Scan Tests in Targeting Marginal Failures and Silent Data Errors in a Data Center Processor.

Suriyaprakash Natarajan, Chaitali S. Oak, Vijay Kakollu, Nipun Chaplot, Soham Roy, Apurva Lonkar, Gerardo J. Perfecto Reyes

Proceedings of the IEEE International Test Conference, 2024

2023

Quantum Implementation of ASCON Linear Layer.

Soham Roy, Anubhab Baksi, Anupam Chattopadhyay

IACR Cryptol. ePrint Arch., 2023

2021

Improved Localized Sleep Scheduling Techniques to Prolong WSN Lifetime.

Nachiketa Tarasia, Amulya Ratna Swain, Soham Roy, Udit Narayana Kar

Scalable Comput. Pract. Exp., 2021

A two-stage CNN-based hand-drawn electrical and electronic circuit component recognition system.

Mrityunjoy Dey, Shoif Md Mia, Navonil Sarkar, Archan Bhattacharya, Soham Roy, Samir Malakar, Ram Sarkar

Neural Comput. Appl., 2021

Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits.

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal

Proceedings of the 39th IEEE VLSI Test Symposium, 2021

Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator.

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal

Proceedings of the 34th International Conference on VLSI Design and 20th International Conference on Embedded Systems, 2021

Unsupervised Learning in Test Generation for Digital Integrated Circuits.

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal

Proceedings of the 26th IEEE European Test Symposium, 2021

Trident U-Net: An Encoder Fusion for Improved Biomedical Image Segmentation.

Rajdeep Chatterjee, Soham Roy, SK Hafizul Islam

Proceedings of the Bioengineering and Biomedical Signal and Image Processing, 2021

2020

Offline hand-drawn circuit component recognition using texture and shape-based features.

Soham Roy, Archan Bhattacharya, Navonil Sarkar, Samir Malakar, Ram Sarkar

Multim. Tools Appl., 2020

Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures.

Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal

J. Electron. Test., 2020

Machine Intelligence for Efficient Test Pattern Generation.

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal

Proceedings of the IEEE International Test Conference, 2020

2019

Improved Random Pattern Delay Fault Coverage Using Inversion Test Points.

Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal

Proceedings of the 28th IEEE North Atlantic Test Workshop, 2019

Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training.

Spencer K. Millican, Yang Sun, Soham Roy, Vishwani D. Agrawal

Proceedings of the 28th IEEE Asian Test Symposium, 2019