Slimane Boutobza

According to our database, Slimane Boutobza authored at least 9 papers between 2001 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Effective and Efficient Test and Diagnosis Pattern Generation for Many Inter-Die Interconnects in Chiplet-Based Packages.

Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Slimane Boutobza, Cheng-Wen Wu, Georges G. E. Gielen, Erik Jan Marinissen

Proceedings of the IEEE International 3D Systems Integration Conference, 2023

2019

Unified STIL Flow: A Test Pattern Validation Approach for Compressed Scan Designs.

Slimane Boutobza, Andrea Costa, Sorin Popa

Proceedings of the 2019 IEEE East-West Design & Test Symposium, 2019

2018

An Automatic Testbench Generator for Test Patterns Validation.

Slimane Boutobza, Sorin Popa, Andrea Costa

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

A Journey from STIL to Verilog.

Slimane Boutobza, Sorin Popa, Andrea Costa

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2006

A Transparent based Programmable Memory BIST.

Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa

Proceedings of the 11th European Test Symposium, 2006

2005

Programmable memory BIST.

Slimane Boutobza, Michael Nicolaidis, Kheiredine M. Lamara, Andrea Costa

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2003

Dynamic Data-bit Memory Built-In Self- Repair.

Michael Nicolaidis, Nadir Achouri, Slimane Boutobza

Proceedings of the 2003 International Conference on Computer-Aided Design, 2003

Optimal Reconfiguration Functions for Column or Data-bit Built-In Self-Repair.

Michael Nicolaidis, Nadir Achouri, Slimane Boutobza

Proceedings of the 2003 Design, 2003

2001

Designing and Implementing Efficient BISR Techniques for Embedded RAMs.

Michael Nicolaidis, Slimane Boutobza, Nadir Achouri, R. D. Shawn Blanton, Julie Segal, David Y. Lepejian, Ben Chu, Tony Singh, Harvey Berman

Proceedings of the 2nd Latin American Test Workshop, 2001